Write-to-read coupling breakdown in HGA

Write-to-read coupling in HGAs has been studied. We report on the relative contribution of the coupling from the suspension interconnect and the slider. By implementing different measurement setups, we have demonstrated both suspension interconnect and slider have a profound contribution. The induce...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on magnetics 2002-09, Vol.38 (5), p.2234-2236
Hauptverfasser: Qing He, Lin, K., Sankar, S., Heng Gong, Holmes, R., Seagle, D.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2236
container_issue 5
container_start_page 2234
container_title IEEE transactions on magnetics
container_volume 38
creator Qing He
Lin, K.
Sankar, S.
Heng Gong
Holmes, R.
Seagle, D.
description Write-to-read coupling in HGAs has been studied. We report on the relative contribution of the coupling from the suspension interconnect and the slider. By implementing different measurement setups, we have demonstrated both suspension interconnect and slider have a profound contribution. The induced read current not only adversely affects read sensor stability, but can cause reader degradation as well.
doi_str_mv 10.1109/TMAG.2002.802680
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28746236</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1042148</ieee_id><sourcerecordid>28746236</sourcerecordid><originalsourceid>FETCH-LOGICAL-c349t-e45f67f0b283212e6201d42d20e15cb17a64b43a1e334d4c50fcd0770723c6b73</originalsourceid><addsrcrecordid>eNpdkMFLwzAUh4MoOKd3wUsR1FPny0uapMcxdBMmXiYeQ5qm0tm1M1kR_3szOlA8PR58vx_vfYRcUphQCvn96nk6nyAAThSgUHBERjTnNAUQ-TEZAVCV5lzwU3IWwjquPKMwIndvvt65dNel3pkysV2_ber2PSni-lF2X21St8liPj0nJ5Vpgrs4zDF5fXxYzRbp8mX-NJsuU8t4vksdzyohKyhQMaToBAItOZYIjma2oNIIXnBmqGOMl9xmUNkSpASJzIpCsjG5HXq3vvvsXdjpTR2saxrTuq4PGpXkApmI4PU_cN31vo23aaXib0wqjBAMkPVdCN5VeuvrjfHfmoLea9N7bXqvTQ_aYuTm0GuCNU3lTWvr8JtjeS4YZpG7GrjaOfenliPliv0A8WByJg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>884513782</pqid></control><display><type>article</type><title>Write-to-read coupling breakdown in HGA</title><source>IEEE Electronic Library (IEL)</source><creator>Qing He ; Lin, K. ; Sankar, S. ; Heng Gong ; Holmes, R. ; Seagle, D.</creator><creatorcontrib>Qing He ; Lin, K. ; Sankar, S. ; Heng Gong ; Holmes, R. ; Seagle, D.</creatorcontrib><description>Write-to-read coupling in HGAs has been studied. We report on the relative contribution of the coupling from the suspension interconnect and the slider. By implementing different measurement setups, we have demonstrated both suspension interconnect and slider have a profound contribution. The induced read current not only adversely affects read sensor stability, but can cause reader degradation as well.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2002.802680</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Current measurement ; Degradation ; Electric breakdown ; Electronics ; Exact sciences and technology ; Magnetic devices ; Magnetic heads ; Magnetic levitation ; Magnetic sensors ; Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc ; Magnetism ; Probes ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Stress ; Testing</subject><ispartof>IEEE transactions on magnetics, 2002-09, Vol.38 (5), p.2234-2236</ispartof><rights>2003 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2002</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c349t-e45f67f0b283212e6201d42d20e15cb17a64b43a1e334d4c50fcd0770723c6b73</citedby><cites>FETCH-LOGICAL-c349t-e45f67f0b283212e6201d42d20e15cb17a64b43a1e334d4c50fcd0770723c6b73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1042148$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23910,23911,25119,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1042148$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=13996325$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Qing He</creatorcontrib><creatorcontrib>Lin, K.</creatorcontrib><creatorcontrib>Sankar, S.</creatorcontrib><creatorcontrib>Heng Gong</creatorcontrib><creatorcontrib>Holmes, R.</creatorcontrib><creatorcontrib>Seagle, D.</creatorcontrib><title>Write-to-read coupling breakdown in HGA</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>Write-to-read coupling in HGAs has been studied. We report on the relative contribution of the coupling from the suspension interconnect and the slider. By implementing different measurement setups, we have demonstrated both suspension interconnect and slider have a profound contribution. The induced read current not only adversely affects read sensor stability, but can cause reader degradation as well.</description><subject>Applied sciences</subject><subject>Current measurement</subject><subject>Degradation</subject><subject>Electric breakdown</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Magnetic devices</subject><subject>Magnetic heads</subject><subject>Magnetic levitation</subject><subject>Magnetic sensors</subject><subject>Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc</subject><subject>Magnetism</subject><subject>Probes</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Stress</subject><subject>Testing</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkMFLwzAUh4MoOKd3wUsR1FPny0uapMcxdBMmXiYeQ5qm0tm1M1kR_3szOlA8PR58vx_vfYRcUphQCvn96nk6nyAAThSgUHBERjTnNAUQ-TEZAVCV5lzwU3IWwjquPKMwIndvvt65dNel3pkysV2_ber2PSni-lF2X21St8liPj0nJ5Vpgrs4zDF5fXxYzRbp8mX-NJsuU8t4vksdzyohKyhQMaToBAItOZYIjma2oNIIXnBmqGOMl9xmUNkSpASJzIpCsjG5HXq3vvvsXdjpTR2saxrTuq4PGpXkApmI4PU_cN31vo23aaXib0wqjBAMkPVdCN5VeuvrjfHfmoLea9N7bXqvTQ_aYuTm0GuCNU3lTWvr8JtjeS4YZpG7GrjaOfenliPliv0A8WByJg</recordid><startdate>20020901</startdate><enddate>20020901</enddate><creator>Qing He</creator><creator>Lin, K.</creator><creator>Sankar, S.</creator><creator>Heng Gong</creator><creator>Holmes, R.</creator><creator>Seagle, D.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20020901</creationdate><title>Write-to-read coupling breakdown in HGA</title><author>Qing He ; Lin, K. ; Sankar, S. ; Heng Gong ; Holmes, R. ; Seagle, D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c349t-e45f67f0b283212e6201d42d20e15cb17a64b43a1e334d4c50fcd0770723c6b73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Applied sciences</topic><topic>Current measurement</topic><topic>Degradation</topic><topic>Electric breakdown</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Magnetic devices</topic><topic>Magnetic heads</topic><topic>Magnetic levitation</topic><topic>Magnetic sensors</topic><topic>Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.); domain-motion devices, etc</topic><topic>Magnetism</topic><topic>Probes</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Stress</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Qing He</creatorcontrib><creatorcontrib>Lin, K.</creatorcontrib><creatorcontrib>Sankar, S.</creatorcontrib><creatorcontrib>Heng Gong</creatorcontrib><creatorcontrib>Holmes, R.</creatorcontrib><creatorcontrib>Seagle, D.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Qing He</au><au>Lin, K.</au><au>Sankar, S.</au><au>Heng Gong</au><au>Holmes, R.</au><au>Seagle, D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Write-to-read coupling breakdown in HGA</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>2002-09-01</date><risdate>2002</risdate><volume>38</volume><issue>5</issue><spage>2234</spage><epage>2236</epage><pages>2234-2236</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Write-to-read coupling in HGAs has been studied. We report on the relative contribution of the coupling from the suspension interconnect and the slider. By implementing different measurement setups, we have demonstrated both suspension interconnect and slider have a profound contribution. The induced read current not only adversely affects read sensor stability, but can cause reader degradation as well.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMAG.2002.802680</doi><tpages>3</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9464
ispartof IEEE transactions on magnetics, 2002-09, Vol.38 (5), p.2234-2236
issn 0018-9464
1941-0069
language eng
recordid cdi_proquest_miscellaneous_28746236
source IEEE Electronic Library (IEL)
subjects Applied sciences
Current measurement
Degradation
Electric breakdown
Electronics
Exact sciences and technology
Magnetic devices
Magnetic heads
Magnetic levitation
Magnetic sensors
Magnetic thin film devices: magnetic heads (magnetoresistive, inductive, etc.)
domain-motion devices, etc
Magnetism
Probes
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Stress
Testing
title Write-to-read coupling breakdown in HGA
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T01%3A52%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Write-to-read%20coupling%20breakdown%20in%20HGA&rft.jtitle=IEEE%20transactions%20on%20magnetics&rft.au=Qing%20He&rft.date=2002-09-01&rft.volume=38&rft.issue=5&rft.spage=2234&rft.epage=2236&rft.pages=2234-2236&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/TMAG.2002.802680&rft_dat=%3Cproquest_RIE%3E28746236%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=884513782&rft_id=info:pmid/&rft_ieee_id=1042148&rfr_iscdi=true