Jitter testing for gigabit serial communication transceivers

Proper testing of transceivers requires the ability not only to measure generated jitter but also to inject in-band as well as out-of-band jitter for an appropriate receiver tolerance test. The article introduces a low-cost method to extend jitter testing to conventional external loop-back testing (...

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Veröffentlicht in:IEEE design & test of computers 2002-01, Vol.19 (1), p.66-74
Hauptverfasser: Yi Cai, Laquai, B., Luehman, K.
Format: Artikel
Sprache:eng
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