Testing and diagnostics of CMOS circuits using light emission from off-state leakage current
In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC c...
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| Veröffentlicht in: | IEEE transactions on electron devices 2004-09, Vol.51 (9), p.1455-1462 |
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| container_end_page | 1462 |
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| container_issue | 9 |
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| container_title | IEEE transactions on electron devices |
| container_volume | 51 |
| creator | Stellari, F. Peilin Song Tsang, J.C. McManus, M.K. Ketchen, M.B. |
| description | In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others. |
| doi_str_mv | 10.1109/TED.2004.833967 |
| format | Article |
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Testing</topic><topic>Electric potential</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronics</topic><topic>Emission analysis</topic><topic>Exact sciences and technology</topic><topic>Gates</topic><topic>Integrated circuit testing</topic><topic>Integrated circuits</topic><topic>Leakage current</topic><topic>Leakage currents</topic><topic>Light emission</topic><topic>Logic circuit testing</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Theoretical study. 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| ispartof | IEEE transactions on electron devices, 2004-09, Vol.51 (9), p.1455-1462 |
| issn | 0018-9383 1557-9646 |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences Circuits CMOS CMOS integrated circuits Design. Technologies. Operation analysis. Testing Electric potential Electric, optical and optoelectronic circuits Electronics Emission analysis Exact sciences and technology Gates Integrated circuit testing Integrated circuits Leakage current Leakage currents Light emission Logic circuit testing Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Theoretical study. Circuits analysis and design Transistors Ultra-large-scale integration Voltage drop |
| title | Testing and diagnostics of CMOS circuits using light emission from off-state leakage current |
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