Testing and diagnostics of CMOS circuits using light emission from off-state leakage current

In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC c...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on electron devices 2004-09, Vol.51 (9), p.1455-1462
Hauptverfasser:	Stellari, F., Peilin Song, Tsang, J.C., McManus, M.K., Ketchen, M.B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuits CMOS CMOS integrated circuits Design. Technologies. Operation analysis. Testing Electric potential Electric, optical and optoelectronic circuits Electronics Emission analysis Exact sciences and technology Gates Integrated circuit testing Integrated circuits Leakage current Leakage currents Light emission Logic circuit testing Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Theoretical study. Circuits analysis and design Transistors Ultra-large-scale integration Voltage drop
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others.
ISSN:	0018-9383 1557-9646
DOI:	10.1109/TED.2004.833967