Characterization of Cr/SiO2 catalysts and ethylene polymerization by XPS

Cr/Si02 catalysts with 1 or 3 wt.% Cr loadings and different chromium precursors were characterized by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). A method to determine chromium species in the sample was developed through the decomposition of the Cr 2p XPS spectrum in Cr6+ an...

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Veröffentlicht in:	Applied surface science 2005-11, Vol.252 (4), p.939-949
Hauptverfasser:	CASPAR, A. B, PEREZ, C. A. C, DIEGUEZ, L. C
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Physics
Online-Zugang:	Volltext
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