Time-resolved plasma properties for double pulsed laser-induced breakdown spectroscopy of silicon
A systematic measurement of plasma properties (temperature, electron number density, pressure) was performed during LIBS of silicon with two nanosecond pulsed lasers operating at 1064 nm. The spectral characteristics of the plasmas were measured to determine the plasma properties as delay time betwe...
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| Veröffentlicht in: | Spectrochimica acta. Part B: Atomic spectroscopy 2005-08, Vol.60 (7), p.960-967 |
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| container_issue | 7 |
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| container_title | Spectrochimica acta. Part B: Atomic spectroscopy |
| container_volume | 60 |
| creator | Mao, Xianglei Zeng, Xianzhong Wen, Sy-Bor Russo, Richard E. |
| description | A systematic measurement of plasma properties (temperature, electron number density, pressure) was performed during LIBS of silicon with two nanosecond pulsed lasers operating at 1064 nm. The spectral characteristics of the plasmas were measured to determine the plasma properties as delay time between the laser pulses was changed from 0 to 10 ms. The plasma properties and crater dimensions increased abruptly from 100 to 200 ns. The crater depth increased from 2 to 10 μm (volume increased about 5 times) per pair of double pulses. Enhanced mass removal was indicative of a phase explosion mechanism. Spatial images of plasma emission were measured to study the dynamics of plasma expansion. |
| doi_str_mv | 10.1016/j.sab.2005.06.012 |
| format | Article |
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The spectral characteristics of the plasmas were measured to determine the plasma properties as delay time between the laser pulses was changed from 0 to 10 ms. The plasma properties and crater dimensions increased abruptly from 100 to 200 ns. The crater depth increased from 2 to 10 μm (volume increased about 5 times) per pair of double pulses. Enhanced mass removal was indicative of a phase explosion mechanism. Spatial images of plasma emission were measured to study the dynamics of plasma expansion.</description><identifier>ISSN: 0584-8547</identifier><identifier>EISSN: 1873-3565</identifier><identifier>DOI: 10.1016/j.sab.2005.06.012</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Double pulse ; Laser ablation ; Laser induced breakdown spectroscopy ; Laser-induced plasmas</subject><ispartof>Spectrochimica acta. 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Part B: Atomic spectroscopy</title><description>A systematic measurement of plasma properties (temperature, electron number density, pressure) was performed during LIBS of silicon with two nanosecond pulsed lasers operating at 1064 nm. The spectral characteristics of the plasmas were measured to determine the plasma properties as delay time between the laser pulses was changed from 0 to 10 ms. The plasma properties and crater dimensions increased abruptly from 100 to 200 ns. The crater depth increased from 2 to 10 μm (volume increased about 5 times) per pair of double pulses. Enhanced mass removal was indicative of a phase explosion mechanism. Spatial images of plasma emission were measured to study the dynamics of plasma expansion.</description><subject>Double pulse</subject><subject>Laser ablation</subject><subject>Laser induced breakdown spectroscopy</subject><subject>Laser-induced plasmas</subject><issn>0584-8547</issn><issn>1873-3565</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAURYMoOI7-AHdZuWtN0iTN4EoGv2DAhbMPafoKGdum5k1H5t8bGdeuQuCcx72XkFvOSs64vt-V6JpSMKZKpkvGxRlZcFNXRaW0OicLpowsjJL1JblC3DHGhBJqQdw2DFAkwNgfoKVT73BwdEpxgrQPgLSLibZxbnqg09xjZjICqQhjO_v8axK4zzZ-jxQn8PsU0cfpSGNHMfTBx_GaXHQuizd_75J8PD9t16_F5v3lbf24KXwlzL6oG1cL0BJWinkFtZKtk7xSK-kM5wyM7rx3TnrFterAcAWaSV13EkTTVEtyd7qao3_NgHs7BPTQ926EOKMVRtdVrpxBfgJ9jooJOjulMLh0tJzZ3yntzuYp7e-Ulmmbp8zOw8mBnP8QIFn0AcZcP6Tc2bYx_GP_AJRUfiw</recordid><startdate>20050831</startdate><enddate>20050831</enddate><creator>Mao, Xianglei</creator><creator>Zeng, Xianzhong</creator><creator>Wen, Sy-Bor</creator><creator>Russo, Richard E.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20050831</creationdate><title>Time-resolved plasma properties for double pulsed laser-induced breakdown spectroscopy of silicon</title><author>Mao, Xianglei ; Zeng, Xianzhong ; Wen, Sy-Bor ; Russo, Richard E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c328t-7ba72e64e950c5e754da413594a8110e86fccaa4c5165fe815e60467f4e2bb3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Double pulse</topic><topic>Laser ablation</topic><topic>Laser induced breakdown spectroscopy</topic><topic>Laser-induced plasmas</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mao, Xianglei</creatorcontrib><creatorcontrib>Zeng, Xianzhong</creatorcontrib><creatorcontrib>Wen, Sy-Bor</creatorcontrib><creatorcontrib>Russo, Richard E.</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Spectrochimica acta. Part B: Atomic spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mao, Xianglei</au><au>Zeng, Xianzhong</au><au>Wen, Sy-Bor</au><au>Russo, Richard E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Time-resolved plasma properties for double pulsed laser-induced breakdown spectroscopy of silicon</atitle><jtitle>Spectrochimica acta. Part B: Atomic spectroscopy</jtitle><date>2005-08-31</date><risdate>2005</risdate><volume>60</volume><issue>7</issue><spage>960</spage><epage>967</epage><pages>960-967</pages><issn>0584-8547</issn><eissn>1873-3565</eissn><abstract>A systematic measurement of plasma properties (temperature, electron number density, pressure) was performed during LIBS of silicon with two nanosecond pulsed lasers operating at 1064 nm. The spectral characteristics of the plasmas were measured to determine the plasma properties as delay time between the laser pulses was changed from 0 to 10 ms. The plasma properties and crater dimensions increased abruptly from 100 to 200 ns. The crater depth increased from 2 to 10 μm (volume increased about 5 times) per pair of double pulses. Enhanced mass removal was indicative of a phase explosion mechanism. Spatial images of plasma emission were measured to study the dynamics of plasma expansion.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.sab.2005.06.012</doi><tpages>8</tpages></addata></record> |
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| issn | 0584-8547 1873-3565 |
| language | eng |
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| source | Elsevier ScienceDirect Journals |
| subjects | Double pulse Laser ablation Laser induced breakdown spectroscopy Laser-induced plasmas |
| title | Time-resolved plasma properties for double pulsed laser-induced breakdown spectroscopy of silicon |
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