Extending chi-squared statistics for key comparisons in metrology

We examine different χ 2 statistics appropriate for high-level metrology. “Key” measurement comparisons often need statistics that can be used before a reference value is chosen. One such statistic is the pair-difference χ 2 , presented here. This is also a natural way to examine bilateral equivalen...

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Veröffentlicht in:	Journal of computational and applied mathematics 2006-07, Vol.192 (1), p.51-58
Hauptverfasser:	Steele, A.G., Douglas, R.J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Distribution theory Exact sciences and technology Key comparison Mathematics Multivariate analysis Null-hypothesis testing Numerical analysis Numerical analysis. Scientific computation Numerical methods in probability and statistics Probability and statistics Reference value Sciences and techniques of general use Statistics
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