Spectroscopic infrared scanning near-field optical microscopy (IR-SNOM)

Scanning near-field optical microscopy (SNOM or NSOM) is the technique with the highest lateral optical resolution available today, while infrared (IR) spectroscopy has a high chemical specificity. Combining SNOM with a tunable IR source produces a unique tool, IR-SNOM, capable of imaging distributi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of alloys and compounds 2005-09, Vol.401 (1), p.80-85
Hauptverfasser:	Vobornik, D., Margaritondo, G., Sanghera, J.S., Thielen, P., Aggarwal, I.D., Ivanov, B., Tolk, N.H., Manni, V., Grimaldi, S., Lisi, A., Rieti, S., Piston, D.W., Generosi, R., Luce, M., Perfetti, P., Cricenti, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Cells Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Exact sciences and technology Infrared spectroscopy NSOM Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc SNOM Structure of solids and liquids crystallography Thin film
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