Theory and experiment of thin-film junction circulator
We have calculated the S-parameters and losses in ferrite-film-junction circulators using a new effective-field theory assuming TEM-like propagation. Conductivity loss dominates the dielectric and magnetic losses in Y-junction circulators fabricated on ferrite films with thicknesses less than 200 /s...
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| Veröffentlicht in: | IEEE transactions on microwave theory and techniques 1998-11, Vol.46 (11), p.1645-1653 |
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| container_end_page | 1653 |
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| container_issue | 11 |
| container_start_page | 1645 |
| container_title | IEEE transactions on microwave theory and techniques |
| container_volume | 46 |
| creator | How, H. Oliver, S.A. McKnight, S.W. Zavracky, P.M. McGruer, N.E. Vittoria, C. Schmidt, R. |
| description | We have calculated the S-parameters and losses in ferrite-film-junction circulators using a new effective-field theory assuming TEM-like propagation. Conductivity loss dominates the dielectric and magnetic losses in Y-junction circulators fabricated on ferrite films with thicknesses less than 200 /spl mu/m. It is plausible to fabricate Y-junction thin-film circulator at X-band with insertion loss less than 0.5 dB if the film thickness is larger than 100 /spl mu/m. The quality of the conductor plane is important in reducing the overall insertion loss of the thin-film-junction circulator. |
| doi_str_mv | 10.1109/22.734547 |
| format | Article |
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Conductivity loss dominates the dielectric and magnetic losses in Y-junction circulators fabricated on ferrite films with thicknesses less than 200 /spl mu/m. It is plausible to fabricate Y-junction thin-film circulator at X-band with insertion loss less than 0.5 dB if the film thickness is larger than 100 /spl mu/m. The quality of the conductor plane is important in reducing the overall insertion loss of the thin-film-junction circulator.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/22.734547</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>IEEE</publisher><subject>Conductivity ; Dielectric losses ; Dielectric thin films ; Ferrite films ; Insertion loss ; Magnetic films ; Magnetic losses ; Propagation losses ; Scattering parameters ; Transistors</subject><ispartof>IEEE transactions on microwave theory and techniques, 1998-11, Vol.46 (11), p.1645-1653</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c405t-beb11d8357bcc8eb3a143f161beb612e6dfd62851ecf0d3301c979edfa5774303</citedby><cites>FETCH-LOGICAL-c405t-beb11d8357bcc8eb3a143f161beb612e6dfd62851ecf0d3301c979edfa5774303</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/734547$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/734547$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>How, H.</creatorcontrib><creatorcontrib>Oliver, S.A.</creatorcontrib><creatorcontrib>McKnight, S.W.</creatorcontrib><creatorcontrib>Zavracky, P.M.</creatorcontrib><creatorcontrib>McGruer, N.E.</creatorcontrib><creatorcontrib>Vittoria, C.</creatorcontrib><creatorcontrib>Schmidt, R.</creatorcontrib><title>Theory and experiment of thin-film junction circulator</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>We have calculated the S-parameters and losses in ferrite-film-junction circulators using a new effective-field theory assuming TEM-like propagation. Conductivity loss dominates the dielectric and magnetic losses in Y-junction circulators fabricated on ferrite films with thicknesses less than 200 /spl mu/m. It is plausible to fabricate Y-junction thin-film circulator at X-band with insertion loss less than 0.5 dB if the film thickness is larger than 100 /spl mu/m. The quality of the conductor plane is important in reducing the overall insertion loss of the thin-film-junction circulator.</description><subject>Conductivity</subject><subject>Dielectric losses</subject><subject>Dielectric thin films</subject><subject>Ferrite films</subject><subject>Insertion loss</subject><subject>Magnetic films</subject><subject>Magnetic losses</subject><subject>Propagation losses</subject><subject>Scattering parameters</subject><subject>Transistors</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0L9Lw0AUB_BDFKzVwdUpk-CQeu9-3yjFqlBwqXNILu9oSpqrdwnY_95IiqtOj8f3w3f4EnILdAFA7SNjC82FFPqMzEBKnVul6TmZUQomt8LQS3KV0m58haRmRtRmiyEes7KrM_w6YGz22PVZ8Fm_bbrcN-0-2w2d65vQZa6JbmjLPsRrcuHLNuHN6c7Jx-p5s3zN1-8vb8unde4ElX1eYQVQGy515ZzBipcguAcFY6CAoap9rZiRgM7TmnMKzmqLtS-l1oJTPif3U-8hhs8BU1_sm-SwbcsOw5AKZpQCsOZvqIwQFuA_kIFlaoQPE3QxpBTRF4dxnDIeC6DFz9YFY8W09WjvJtsg4q87hd8gTnic</recordid><startdate>19981101</startdate><enddate>19981101</enddate><creator>How, H.</creator><creator>Oliver, S.A.</creator><creator>McKnight, S.W.</creator><creator>Zavracky, P.M.</creator><creator>McGruer, N.E.</creator><creator>Vittoria, C.</creator><creator>Schmidt, R.</creator><general>IEEE</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>H8D</scope></search><sort><creationdate>19981101</creationdate><title>Theory and experiment of thin-film junction circulator</title><author>How, H. ; Oliver, S.A. ; McKnight, S.W. ; Zavracky, P.M. ; McGruer, N.E. ; Vittoria, C. ; Schmidt, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c405t-beb11d8357bcc8eb3a143f161beb612e6dfd62851ecf0d3301c979edfa5774303</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Conductivity</topic><topic>Dielectric losses</topic><topic>Dielectric thin films</topic><topic>Ferrite films</topic><topic>Insertion loss</topic><topic>Magnetic films</topic><topic>Magnetic losses</topic><topic>Propagation losses</topic><topic>Scattering parameters</topic><topic>Transistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>How, H.</creatorcontrib><creatorcontrib>Oliver, S.A.</creatorcontrib><creatorcontrib>McKnight, S.W.</creatorcontrib><creatorcontrib>Zavracky, P.M.</creatorcontrib><creatorcontrib>McGruer, N.E.</creatorcontrib><creatorcontrib>Vittoria, C.</creatorcontrib><creatorcontrib>Schmidt, R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Aerospace Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>How, H.</au><au>Oliver, S.A.</au><au>McKnight, S.W.</au><au>Zavracky, P.M.</au><au>McGruer, N.E.</au><au>Vittoria, C.</au><au>Schmidt, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Theory and experiment of thin-film junction circulator</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1998-11-01</date><risdate>1998</risdate><volume>46</volume><issue>11</issue><spage>1645</spage><epage>1653</epage><pages>1645-1653</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>We have calculated the S-parameters and losses in ferrite-film-junction circulators using a new effective-field theory assuming TEM-like propagation. Conductivity loss dominates the dielectric and magnetic losses in Y-junction circulators fabricated on ferrite films with thicknesses less than 200 /spl mu/m. It is plausible to fabricate Y-junction thin-film circulator at X-band with insertion loss less than 0.5 dB if the film thickness is larger than 100 /spl mu/m. The quality of the conductor plane is important in reducing the overall insertion loss of the thin-film-junction circulator.</abstract><pub>IEEE</pub><doi>10.1109/22.734547</doi><tpages>9</tpages></addata></record> |
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| ispartof | IEEE transactions on microwave theory and techniques, 1998-11, Vol.46 (11), p.1645-1653 |
| issn | 0018-9480 1557-9670 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_28661198 |
| source | IEEE Electronic Library (IEL) |
| subjects | Conductivity Dielectric losses Dielectric thin films Ferrite films Insertion loss Magnetic films Magnetic losses Propagation losses Scattering parameters Transistors |
| title | Theory and experiment of thin-film junction circulator |
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