Structural and magnetic properties of Fe films epitaxially grown on Pd[001]/Cu[001]/Si[001] by sputtering

5-150 nm Fe[001]/70 nm Pd[001]/85 nm Cu [001] films were epitaxially grown on Si[001] by RF sputtering. Magnetic and structural properties were analyzed by VSM, torque magnetometer and X-ray diffractometer. Epitaxial relationship of Fe[001][110]/spl par/Pd[001][010]/spl par/Cu[001][010]/spl par/Si[0...

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Veröffentlicht in:	IEEE transactions on magnetics 1999-09, Vol.35 (5), p.3079-3081
Hauptverfasser:	Choi, Tae Won, Yu, Sung Cho, Jang, Pyung Woo, Kim, Won Tae
Format:	Artikel
Sprache:	eng
Schlagworte:	Anisotropic magnetoresistance Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures) Iron Magnetic analysis Magnetic anisotropy Magnetic films Magnetic properties Magnetic properties and materials Magnetic properties of surface, thin films and multilayers Perpendicular magnetic anisotropy Physics Radio frequency Sputtering Torque
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