Study of strong interaction between Pt and TiO2 under oxidizing atmosphere
The strong interaction between Pt and TiO2 under oxidizing atmosphere was studied by means of X-ray photoelectron spectroscopy (XPS) and Ar+ sputtering test. The results obtained show that under oxidizing atmosphere Pt0 atoms can thermally diffuse into TiO2 lattice and be oxidized to Pt2+ to substit...
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| Veröffentlicht in: | Applied surface science 2005-08, Vol.250 (1-4), p.29-34 |
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| container_end_page | 34 |
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| container_issue | 1-4 |
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| container_title | Applied surface science |
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| creator | Zhang, Min Jin, Zhensheng Zhang, Zhijun Dang, Hongxin |
| description | The strong interaction between Pt and TiO2 under oxidizing atmosphere was studied by means of X-ray photoelectron spectroscopy (XPS) and Ar+ sputtering test. The results obtained show that under oxidizing atmosphere Pt0 atoms can thermally diffuse into TiO2 lattice and be oxidized to Pt2+ to substitute for Ti4+ or form the interstitial ions at 673K. |
| doi_str_mv | 10.1016/j.apsusc.2004.12.032 |
| format | Article |
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The results obtained show that under oxidizing atmosphere Pt0 atoms can thermally diffuse into TiO2 lattice and be oxidized to Pt2+ to substitute for Ti4+ or form the interstitial ions at 673K.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2004.12.032</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Ar ion sputtering ; Condensed matter: structure, mechanical and thermal properties ; Diffusion; interface formation ; Exact sciences and technology ; Physics ; Pt–TiO2 strong interaction ; Solid surfaces and solid-solid interfaces ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; XPS</subject><ispartof>Applied surface science, 2005-08, Vol.250 (1-4), p.29-34</ispartof><rights>2004 Elsevier B.V.</rights><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0169433204018409$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17051010$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Zhang, Min</creatorcontrib><creatorcontrib>Jin, Zhensheng</creatorcontrib><creatorcontrib>Zhang, Zhijun</creatorcontrib><creatorcontrib>Dang, Hongxin</creatorcontrib><title>Study of strong interaction between Pt and TiO2 under oxidizing atmosphere</title><title>Applied surface science</title><description>The strong interaction between Pt and TiO2 under oxidizing atmosphere was studied by means of X-ray photoelectron spectroscopy (XPS) and Ar+ sputtering test. The results obtained show that under oxidizing atmosphere Pt0 atoms can thermally diffuse into TiO2 lattice and be oxidized to Pt2+ to substitute for Ti4+ or form the interstitial ions at 673K.</description><subject>Ar ion sputtering</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Diffusion; interface formation</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Pt–TiO2 strong interaction</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>XPS</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNot0EtLAzEQwPEgCtbHN_CQi952nSTNNr0IIj4pVFDPIU0mmtJma5L19emN1NMc5scw_Ak5YdAyYN35sjWbPGTbcoBxy3gLgu-QEVMT0UipxrtkVNm0GQvB98lBzksAxut2RB6eyuC-ae9pLqmPrzTEgsnYEvpIF1g-ESN9LNRER5_DnNMhOky0_wou_ITqTVn3efOGCY_InjerjMf_85C83Fw_X901s_nt_dXlrEEOrDSd59YokBwMVw5BMPDKL8C4xcIA9_VhKUBIyY3zvnOdmqBUbuLUVHTdFMUhOdve3aT-fcBc9Dpki6uVidgPWXPVjWUHrMLTf2iyNSufTLQh600Ka5O-NZuArPmguoutw_r1R8Cksw0YLbqQ0Bbt-qAZ6L_Ueqm3qfVfas24rqnFL6UydHQ</recordid><startdate>20050831</startdate><enddate>20050831</enddate><creator>Zhang, Min</creator><creator>Jin, Zhensheng</creator><creator>Zhang, Zhijun</creator><creator>Dang, Hongxin</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>7QQ</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20050831</creationdate><title>Study of strong interaction between Pt and TiO2 under oxidizing atmosphere</title><author>Zhang, Min ; Jin, Zhensheng ; Zhang, Zhijun ; Dang, Hongxin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-e201t-6f2ca80520a28de0310f8fb0adbba02f5585303552adff6d687e58d7d893669e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Ar ion sputtering</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Diffusion; interface formation</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Pt–TiO2 strong interaction</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>XPS</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Min</creatorcontrib><creatorcontrib>Jin, Zhensheng</creatorcontrib><creatorcontrib>Zhang, Zhijun</creatorcontrib><creatorcontrib>Dang, Hongxin</creatorcontrib><collection>Pascal-Francis</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhang, Min</au><au>Jin, Zhensheng</au><au>Zhang, Zhijun</au><au>Dang, Hongxin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Study of strong interaction between Pt and TiO2 under oxidizing atmosphere</atitle><jtitle>Applied surface science</jtitle><date>2005-08-31</date><risdate>2005</risdate><volume>250</volume><issue>1-4</issue><spage>29</spage><epage>34</epage><pages>29-34</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>The strong interaction between Pt and TiO2 under oxidizing atmosphere was studied by means of X-ray photoelectron spectroscopy (XPS) and Ar+ sputtering test. The results obtained show that under oxidizing atmosphere Pt0 atoms can thermally diffuse into TiO2 lattice and be oxidized to Pt2+ to substitute for Ti4+ or form the interstitial ions at 673K.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2004.12.032</doi><tpages>6</tpages></addata></record> |
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| ispartof | Applied surface science, 2005-08, Vol.250 (1-4), p.29-34 |
| issn | 0169-4332 1873-5584 |
| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Ar ion sputtering Condensed matter: structure, mechanical and thermal properties Diffusion interface formation Exact sciences and technology Physics Pt–TiO2 strong interaction Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) XPS |
| title | Study of strong interaction between Pt and TiO2 under oxidizing atmosphere |
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