Surface roughness and laser damage threshold
The essential results of a carefully controlled experimental investigation of the effect of roughness on laser-induced surface damage thresholds in fused silica are reported. Sets of fused silica samples were subjected to several surface preparations such that rms surface roughness values within eac...
Gespeichert in:
| Veröffentlicht in: | IEEE journal of quantum electronics 1977-05, Vol.13 (5), p.361-363 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 363 |
|---|---|
| container_issue | 5 |
| container_start_page | 361 |
| container_title | IEEE journal of quantum electronics |
| container_volume | 13 |
| creator | House, R. Bettis, J. Guenther, A. |
| description | The essential results of a carefully controlled experimental investigation of the effect of roughness on laser-induced surface damage thresholds in fused silica are reported. Sets of fused silica samples were subjected to several surface preparations such that rms surface roughness values within each set varied over two orders of magnitude. A plot of surface damage threshold versus surface roughness shows that there is a strong dependence of threshold on roughness, that this dependence exhibits a simple functional form, and that this relationship appears to hold even for the smoothest of optical surfaces. The utility of the observed threshold-roughness relationship is discussed. |
| doi_str_mv | 10.1109/JQE.1977.1069342 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28636061</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1069342</ieee_id><sourcerecordid>28636061</sourcerecordid><originalsourceid>FETCH-LOGICAL-c323t-30f6b86a1773a8f4a9a7d9d7aa775ba32a6b86faffadc341435b6b50511ed7e43</originalsourceid><addsrcrecordid>eNqFkL9PwzAQhS0EEqWwI7FkYiLBFzt2PKKq5YcqIQTM1iU-t0VpU-xm4L8nUTqwMZ2e3vdu-Bi7Bp4BcHP_8jbPwGidAVdGyPyETaAoyhQ0iFM24RzK1PTAObuI8auPUpZ8wu7eu-CxpiS03Wq9oxgT3LmkwUghcbjFFSWHdaC4bht3yc48NpGujnfKPhfzj9lTunx9fJ49LNNa5OKQCu5VVSoErQWWXqJB7YzTiFoXFYoch9qj9-hqIUGKolJVwQsAcpqkmLLb8e8-tN8dxYPdbmJNTYM7arto81IJxRX8D-ZGKS4GkI9gHdoYA3m7D5sthh8L3A7-bO_PDv7s0V8_uRknGyL6g4_tLwHrawc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>22966031</pqid></control><display><type>article</type><title>Surface roughness and laser damage threshold</title><source>IEEE Electronic Library (IEL)</source><creator>House, R. ; Bettis, J. ; Guenther, A.</creator><creatorcontrib>House, R. ; Bettis, J. ; Guenther, A.</creatorcontrib><description>The essential results of a carefully controlled experimental investigation of the effect of roughness on laser-induced surface damage thresholds in fused silica are reported. Sets of fused silica samples were subjected to several surface preparations such that rms surface roughness values within each set varied over two orders of magnitude. A plot of surface damage threshold versus surface roughness shows that there is a strong dependence of threshold on roughness, that this dependence exhibits a simple functional form, and that this relationship appears to hold even for the smoothest of optical surfaces. The utility of the observed threshold-roughness relationship is discussed.</description><identifier>ISSN: 0018-9197</identifier><identifier>EISSN: 1558-1713</identifier><identifier>DOI: 10.1109/JQE.1977.1069342</identifier><identifier>CODEN: IEJQA7</identifier><language>eng</language><publisher>IEEE</publisher><subject>Fires ; Optical control ; Optical scattering ; Plasma measurements ; Rough surfaces ; Silicon compounds ; Surface emitting lasers ; Surface roughness ; Surface topography ; Surface treatment</subject><ispartof>IEEE journal of quantum electronics, 1977-05, Vol.13 (5), p.361-363</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c323t-30f6b86a1773a8f4a9a7d9d7aa775ba32a6b86faffadc341435b6b50511ed7e43</citedby><cites>FETCH-LOGICAL-c323t-30f6b86a1773a8f4a9a7d9d7aa775ba32a6b86faffadc341435b6b50511ed7e43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1069342$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1069342$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>House, R.</creatorcontrib><creatorcontrib>Bettis, J.</creatorcontrib><creatorcontrib>Guenther, A.</creatorcontrib><title>Surface roughness and laser damage threshold</title><title>IEEE journal of quantum electronics</title><addtitle>JQE</addtitle><description>The essential results of a carefully controlled experimental investigation of the effect of roughness on laser-induced surface damage thresholds in fused silica are reported. Sets of fused silica samples were subjected to several surface preparations such that rms surface roughness values within each set varied over two orders of magnitude. A plot of surface damage threshold versus surface roughness shows that there is a strong dependence of threshold on roughness, that this dependence exhibits a simple functional form, and that this relationship appears to hold even for the smoothest of optical surfaces. The utility of the observed threshold-roughness relationship is discussed.</description><subject>Fires</subject><subject>Optical control</subject><subject>Optical scattering</subject><subject>Plasma measurements</subject><subject>Rough surfaces</subject><subject>Silicon compounds</subject><subject>Surface emitting lasers</subject><subject>Surface roughness</subject><subject>Surface topography</subject><subject>Surface treatment</subject><issn>0018-9197</issn><issn>1558-1713</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1977</creationdate><recordtype>article</recordtype><recordid>eNqFkL9PwzAQhS0EEqWwI7FkYiLBFzt2PKKq5YcqIQTM1iU-t0VpU-xm4L8nUTqwMZ2e3vdu-Bi7Bp4BcHP_8jbPwGidAVdGyPyETaAoyhQ0iFM24RzK1PTAObuI8auPUpZ8wu7eu-CxpiS03Wq9oxgT3LmkwUghcbjFFSWHdaC4bht3yc48NpGujnfKPhfzj9lTunx9fJ49LNNa5OKQCu5VVSoErQWWXqJB7YzTiFoXFYoch9qj9-hqIUGKolJVwQsAcpqkmLLb8e8-tN8dxYPdbmJNTYM7arto81IJxRX8D-ZGKS4GkI9gHdoYA3m7D5sthh8L3A7-bO_PDv7s0V8_uRknGyL6g4_tLwHrawc</recordid><startdate>19770501</startdate><enddate>19770501</enddate><creator>House, R.</creator><creator>Bettis, J.</creator><creator>Guenther, A.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope><scope>7U5</scope></search><sort><creationdate>19770501</creationdate><title>Surface roughness and laser damage threshold</title><author>House, R. ; Bettis, J. ; Guenther, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c323t-30f6b86a1773a8f4a9a7d9d7aa775ba32a6b86faffadc341435b6b50511ed7e43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1977</creationdate><topic>Fires</topic><topic>Optical control</topic><topic>Optical scattering</topic><topic>Plasma measurements</topic><topic>Rough surfaces</topic><topic>Silicon compounds</topic><topic>Surface emitting lasers</topic><topic>Surface roughness</topic><topic>Surface topography</topic><topic>Surface treatment</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>House, R.</creatorcontrib><creatorcontrib>Bettis, J.</creatorcontrib><creatorcontrib>Guenther, A.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>IEEE journal of quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>House, R.</au><au>Bettis, J.</au><au>Guenther, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Surface roughness and laser damage threshold</atitle><jtitle>IEEE journal of quantum electronics</jtitle><stitle>JQE</stitle><date>1977-05-01</date><risdate>1977</risdate><volume>13</volume><issue>5</issue><spage>361</spage><epage>363</epage><pages>361-363</pages><issn>0018-9197</issn><eissn>1558-1713</eissn><coden>IEJQA7</coden><abstract>The essential results of a carefully controlled experimental investigation of the effect of roughness on laser-induced surface damage thresholds in fused silica are reported. Sets of fused silica samples were subjected to several surface preparations such that rms surface roughness values within each set varied over two orders of magnitude. A plot of surface damage threshold versus surface roughness shows that there is a strong dependence of threshold on roughness, that this dependence exhibits a simple functional form, and that this relationship appears to hold even for the smoothest of optical surfaces. The utility of the observed threshold-roughness relationship is discussed.</abstract><pub>IEEE</pub><doi>10.1109/JQE.1977.1069342</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9197 |
| ispartof | IEEE journal of quantum electronics, 1977-05, Vol.13 (5), p.361-363 |
| issn | 0018-9197 1558-1713 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_28636061 |
| source | IEEE Electronic Library (IEL) |
| subjects | Fires Optical control Optical scattering Plasma measurements Rough surfaces Silicon compounds Surface emitting lasers Surface roughness Surface topography Surface treatment |
| title | Surface roughness and laser damage threshold |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T12%3A13%3A23IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Surface%20roughness%20and%20laser%20damage%20threshold&rft.jtitle=IEEE%20journal%20of%20quantum%20electronics&rft.au=House,%20R.&rft.date=1977-05-01&rft.volume=13&rft.issue=5&rft.spage=361&rft.epage=363&rft.pages=361-363&rft.issn=0018-9197&rft.eissn=1558-1713&rft.coden=IEJQA7&rft_id=info:doi/10.1109/JQE.1977.1069342&rft_dat=%3Cproquest_RIE%3E28636061%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=22966031&rft_id=info:pmid/&rft_ieee_id=1069342&rfr_iscdi=true |