Optical constants of platinum octaethyl porphyrin in single-layer organic light emitting diode studied by spectroscopic ellipsometry

We studied the optical properties of platinum octaethyl porphyrin (PtOEP) emitting layer in single-layer organic light emitting diode (OLED) device and in thin film grown on quartz plate using a phase modulated spectroscopic ellipsometry. Spectra of optical constants (refractive index n and extincti...

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Veröffentlicht in:	Thin solid films 2006-02, Vol.496 (2), p.674-678
Hauptverfasser:	Tsuboi, Taiju, Wasai, Yoko, Nabatova-Gabain, Nataliya
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronics Ellipsometry Exact sciences and technology Light-emitting devices Optical constants Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Optoelectronic devices Organic light emitting diode Physics Platinum octaethyl porphine Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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