Oscillations in the thickness dependences of the room-temperature Seebeck coefficient in SnTe thin films

The dependences of the Seebeck coefficient S on the thickness ( d = 5–110 nm) of SnTe thin films grown by thermal evaporation in vacuum on (001)KCl substrates were obtained at room temperature. Distinct oscillations in the S( d)-dependences were observed and attributed to the size quantization effec...

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Veröffentlicht in:	Thin solid films 2005-07, Vol.484 (1), p.433-437
Hauptverfasser:	Rogacheva, E.I., Nashchekina, O.N., Vekhov, Ye.O., Dresselhaus, M.S., Dresselhaus, G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Electrical properties and measurements Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport phenomena in thin films and low-dimensional structures Epitaxy Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics Quantum effects Thermoelectric effects Tin telluride Vapor phase epitaxy growth from vapor phase
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