Application of a high temperature chamber for X-ray stress analysis

Application of a high temperature chamber for X-ray stress analysis

The adhesion strength as well as the crack resistance of hard CVD coatings on cutting tools are widely influenced by the appertaining residual stress states. They are generated during cooling down from coating temperature, or during a subsequent heat treatment. To enhance the knowledge of the residu...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Materialprüfung 2005-01, Vol.47 (5), p.294-298
Hauptverfasser: Ott, Michael H., Kämpfe, Andreas, Löhe, Detlef
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 298
container_issue 5
container_start_page 294
container_title Materialprüfung
container_volume 47
creator Ott, Michael H.
Kämpfe, Andreas
Löhe, Detlef
description The adhesion strength as well as the crack resistance of hard CVD coatings on cutting tools are widely influenced by the appertaining residual stress states. They are generated during cooling down from coating temperature, or during a subsequent heat treatment. To enhance the knowledge of the residual stress development in such CVD coatings on steels, X-ray residual stress analyses were performed during the cooling process. Therefore, a high temperature chamber for a Ψ-diffractometer was developed and manufactured. It allows X-ray residual stress analyses at temperatures of up to at least 1000°C using a measuring range of 2θ ≥ 94° at |Ψ| ≤ 60°.
doi_str_mv 10.3139/120.100658
format Article
fullrecord <record><control><sourceid>proquest_walte</sourceid><recordid>TN_cdi_proquest_miscellaneous_28588059</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>28588059</sourcerecordid><originalsourceid>FETCH-LOGICAL-p165t-61a0fcc0ee5c837e3c791fb01da5cb69ce0f8d4a6023e5da4b2e8e3d51ea96873</originalsourceid><addsrcrecordid>eNotkEFLwzAYhoMoOKcXf0FO3jq_JE2aHMdQJwy8KHgrX9OvW0e31iRF9u_tmKf3PTy8vDyMPQpYKKHcs5CwEABG2ys2k8LpzOpCXrMZgNSZVgC37C7G_RmR0szYajkMXesxtf2R9w1Hvmu3O57oMFDANAbifoeHigJv-sC_s4AnHlOgGDkesTvFNt6zmwa7SA__OWdfry-fq3W2-Xh7Xy032SCMTpkRCI33QKS9VQUpXzjRVCBq1L4yzhM0ts7RgFSka8wrSZZUrQWhM7ZQc_Z02R1C_zNSTOWhjZ66Do_Uj7GUVlsL2k2gvYC_2CUKNW3DeJpKue_HMJ2OpYDy7KucfJUXX3mhpcvVH7fhX1Y</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28588059</pqid></control><display><type>article</type><title>Application of a high temperature chamber for X-ray stress analysis</title><source>De Gruyter journals</source><creator>Ott, Michael H. ; Kämpfe, Andreas ; Löhe, Detlef</creator><creatorcontrib>Ott, Michael H. ; Kämpfe, Andreas ; Löhe, Detlef</creatorcontrib><description>The adhesion strength as well as the crack resistance of hard CVD coatings on cutting tools are widely influenced by the appertaining residual stress states. They are generated during cooling down from coating temperature, or during a subsequent heat treatment. To enhance the knowledge of the residual stress development in such CVD coatings on steels, X-ray residual stress analyses were performed during the cooling process. Therefore, a high temperature chamber for a Ψ-diffractometer was developed and manufactured. It allows X-ray residual stress analyses at temperatures of up to at least 1000°C using a measuring range of 2θ ≥ 94° at |Ψ| ≤ 60°.</description><identifier>ISSN: 0025-5300</identifier><identifier>EISSN: 2195-8572</identifier><identifier>DOI: 10.3139/120.100658</identifier><language>eng</language><publisher>De Gruyter</publisher><ispartof>Materialprüfung, 2005-01, Vol.47 (5), p.294-298</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.degruyter.com/document/doi/10.3139/120.100658/pdf$$EPDF$$P50$$Gwalterdegruyter$$H</linktopdf><linktohtml>$$Uhttps://www.degruyter.com/document/doi/10.3139/120.100658/html$$EHTML$$P50$$Gwalterdegruyter$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,66754,68538</link.rule.ids></links><search><creatorcontrib>Ott, Michael H.</creatorcontrib><creatorcontrib>Kämpfe, Andreas</creatorcontrib><creatorcontrib>Löhe, Detlef</creatorcontrib><title>Application of a high temperature chamber for X-ray stress analysis</title><title>Materialprüfung</title><description>The adhesion strength as well as the crack resistance of hard CVD coatings on cutting tools are widely influenced by the appertaining residual stress states. They are generated during cooling down from coating temperature, or during a subsequent heat treatment. To enhance the knowledge of the residual stress development in such CVD coatings on steels, X-ray residual stress analyses were performed during the cooling process. Therefore, a high temperature chamber for a Ψ-diffractometer was developed and manufactured. It allows X-ray residual stress analyses at temperatures of up to at least 1000°C using a measuring range of 2θ ≥ 94° at |Ψ| ≤ 60°.</description><issn>0025-5300</issn><issn>2195-8572</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNotkEFLwzAYhoMoOKcXf0FO3jq_JE2aHMdQJwy8KHgrX9OvW0e31iRF9u_tmKf3PTy8vDyMPQpYKKHcs5CwEABG2ys2k8LpzOpCXrMZgNSZVgC37C7G_RmR0szYajkMXesxtf2R9w1Hvmu3O57oMFDANAbifoeHigJv-sC_s4AnHlOgGDkesTvFNt6zmwa7SA__OWdfry-fq3W2-Xh7Xy032SCMTpkRCI33QKS9VQUpXzjRVCBq1L4yzhM0ts7RgFSka8wrSZZUrQWhM7ZQc_Z02R1C_zNSTOWhjZ66Do_Uj7GUVlsL2k2gvYC_2CUKNW3DeJpKue_HMJ2OpYDy7KucfJUXX3mhpcvVH7fhX1Y</recordid><startdate>20050101</startdate><enddate>20050101</enddate><creator>Ott, Michael H.</creator><creator>Kämpfe, Andreas</creator><creator>Löhe, Detlef</creator><general>De Gruyter</general><scope>7TB</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>JG9</scope></search><sort><creationdate>20050101</creationdate><title>Application of a high temperature chamber for X-ray stress analysis</title><author>Ott, Michael H. ; Kämpfe, Andreas ; Löhe, Detlef</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p165t-61a0fcc0ee5c837e3c791fb01da5cb69ce0f8d4a6023e5da4b2e8e3d51ea96873</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ott, Michael H.</creatorcontrib><creatorcontrib>Kämpfe, Andreas</creatorcontrib><creatorcontrib>Löhe, Detlef</creatorcontrib><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Materials Research Database</collection><jtitle>Materialprüfung</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ott, Michael H.</au><au>Kämpfe, Andreas</au><au>Löhe, Detlef</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Application of a high temperature chamber for X-ray stress analysis</atitle><jtitle>Materialprüfung</jtitle><date>2005-01-01</date><risdate>2005</risdate><volume>47</volume><issue>5</issue><spage>294</spage><epage>298</epage><pages>294-298</pages><issn>0025-5300</issn><eissn>2195-8572</eissn><abstract>The adhesion strength as well as the crack resistance of hard CVD coatings on cutting tools are widely influenced by the appertaining residual stress states. They are generated during cooling down from coating temperature, or during a subsequent heat treatment. To enhance the knowledge of the residual stress development in such CVD coatings on steels, X-ray residual stress analyses were performed during the cooling process. Therefore, a high temperature chamber for a Ψ-diffractometer was developed and manufactured. It allows X-ray residual stress analyses at temperatures of up to at least 1000°C using a measuring range of 2θ ≥ 94° at |Ψ| ≤ 60°.</abstract><pub>De Gruyter</pub><doi>10.3139/120.100658</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0025-5300
ispartof Materialprüfung, 2005-01, Vol.47 (5), p.294-298
issn 0025-5300
2195-8572
language eng
recordid cdi_proquest_miscellaneous_28588059
source De Gruyter journals
title Application of a high temperature chamber for X-ray stress analysis
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T17%3A24%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_walte&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Application%20of%20a%20high%20temperature%20chamber%20for%20X-ray%20stress%20analysis&rft.jtitle=Materialpr%C3%BCfung&rft.au=Ott,%20Michael%20H.&rft.date=2005-01-01&rft.volume=47&rft.issue=5&rft.spage=294&rft.epage=298&rft.pages=294-298&rft.issn=0025-5300&rft.eissn=2195-8572&rft_id=info:doi/10.3139/120.100658&rft_dat=%3Cproquest_walte%3E28588059%3C/proquest_walte%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28588059&rft_id=info:pmid/&rfr_iscdi=true