Effect of temperature on the initial, thermal oxidation of zirconium

A novel, methodological approach by combined in situ ellipsometry and angle-resolved X-ray photoelectron spectroscopy (AR-XPS) has been applied to investigate the initial oxidation of zirconium within the temperature range 373–773 K. The effective-depth distributions and individual sublayer thicknes...

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Veröffentlicht in:	Acta materialia 2005-06, Vol.53 (10), p.2925-2935
Hauptverfasser:	Lyapin, A., Jeurgens, L.P.H., Mittemeijer, E.J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Angle-resolved XPS Applied sciences Ellipsometry Exact sciences and technology Metals. Metallurgy Microstructure Oxidation Thin film
Online-Zugang:	Volltext
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