Performance enhancement of scan converter-based transient digitizers by digital image processing

A method for the enhancement of dynamic performance of scan converter-based transient digitizers is proposed. First, a technique for discriminating the best diode target region is illustrated. Then, by considering the digitized charge distribution on the target as a digital image, a filtering algori...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on instrumentation and measurement 1996-04, Vol.45 (2), p.422-425
Hauptverfasser: Arpaia, P., Cennamo, F., Daponte, P., D'Apuzzo, P.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 425
container_issue 2
container_start_page 422
container_title IEEE transactions on instrumentation and measurement
container_volume 45
creator Arpaia, P.
Cennamo, F.
Daponte, P.
D'Apuzzo, P.
description A method for the enhancement of dynamic performance of scan converter-based transient digitizers is proposed. First, a technique for discriminating the best diode target region is illustrated. Then, by considering the digitized charge distribution on the target as a digital image, a filtering algorithm capable of recovering trace discontinuities is shown. Results of tests carried out on an actual digitizer are reported.
doi_str_mv 10.1109/19.492759
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28514560</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>492759</ieee_id><sourcerecordid>28514560</sourcerecordid><originalsourceid>FETCH-LOGICAL-c337t-60024555738167d9bdf728000e735221293b9efb5d60c20553994860aed18c183</originalsourceid><addsrcrecordid>eNqFkLtPwzAQxi0EEqUwsDJ5QEgMAT_i14gqXlIlGGAOjnMpRqlT7BSp_PW4StWV6XS633333YfQOSU3lBJzS81NaZgS5gBNqBCqMFKyQzQhhOrClEIeo5OUvgghSpZqgj5eIbZ9XNrgAEP43NYlhAH3LU7OBuz68ANxgFjUNkGDh2hD8lui8Qs_-F-ICdebsbMd9ku7ALyKvYOUfFicoqPWdgnOdnWK3h_u32ZPxfzl8Xl2Ny8c52ooJCGsFNkw11SqxtRNq5jONkFxwRhlhtcG2lo0kjhGhODGlFoSCw3Vjmo-RVejbj79vYY0VEufHHSdDdCvU8W0oPl98j8oORWlLDN4PYIu9ilFaKtVzN_FTUVJtQ27oqYaw87s5U7U5tS6NofkfNovcMq4VjJjFyPmAWA_3Wn8AWz7hfs</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26315464</pqid></control><display><type>article</type><title>Performance enhancement of scan converter-based transient digitizers by digital image processing</title><source>IEEE Electronic Library (IEL)</source><creator>Arpaia, P. ; Cennamo, F. ; Daponte, P. ; D'Apuzzo, P.</creator><creatorcontrib>Arpaia, P. ; Cennamo, F. ; Daponte, P. ; D'Apuzzo, P.</creatorcontrib><description>A method for the enhancement of dynamic performance of scan converter-based transient digitizers is proposed. First, a technique for discriminating the best diode target region is illustrated. Then, by considering the digitized charge distribution on the target as a digital image, a filtering algorithm capable of recovering trace discontinuities is shown. Results of tests carried out on an actual digitizer are reported.</description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/19.492759</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Detectors ; Digital filters ; Digital images ; Electron beams ; Exact sciences and technology ; Filtering algorithms ; Image converters ; Information, signal and communications theory ; Sampling, quantization ; Semiconductor diodes ; Signal and communications theory ; Telecommunications and information theory ; Testing ; Two dimensional displays ; Writing</subject><ispartof>IEEE transactions on instrumentation and measurement, 1996-04, Vol.45 (2), p.422-425</ispartof><rights>1996 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c337t-60024555738167d9bdf728000e735221293b9efb5d60c20553994860aed18c183</citedby><cites>FETCH-LOGICAL-c337t-60024555738167d9bdf728000e735221293b9efb5d60c20553994860aed18c183</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/492759$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23909,23910,25118,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/492759$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=3123876$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Arpaia, P.</creatorcontrib><creatorcontrib>Cennamo, F.</creatorcontrib><creatorcontrib>Daponte, P.</creatorcontrib><creatorcontrib>D'Apuzzo, P.</creatorcontrib><title>Performance enhancement of scan converter-based transient digitizers by digital image processing</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>A method for the enhancement of dynamic performance of scan converter-based transient digitizers is proposed. First, a technique for discriminating the best diode target region is illustrated. Then, by considering the digitized charge distribution on the target as a digital image, a filtering algorithm capable of recovering trace discontinuities is shown. Results of tests carried out on an actual digitizer are reported.</description><subject>Applied sciences</subject><subject>Detectors</subject><subject>Digital filters</subject><subject>Digital images</subject><subject>Electron beams</subject><subject>Exact sciences and technology</subject><subject>Filtering algorithms</subject><subject>Image converters</subject><subject>Information, signal and communications theory</subject><subject>Sampling, quantization</subject><subject>Semiconductor diodes</subject><subject>Signal and communications theory</subject><subject>Telecommunications and information theory</subject><subject>Testing</subject><subject>Two dimensional displays</subject><subject>Writing</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNqFkLtPwzAQxi0EEqUwsDJ5QEgMAT_i14gqXlIlGGAOjnMpRqlT7BSp_PW4StWV6XS633333YfQOSU3lBJzS81NaZgS5gBNqBCqMFKyQzQhhOrClEIeo5OUvgghSpZqgj5eIbZ9XNrgAEP43NYlhAH3LU7OBuz68ANxgFjUNkGDh2hD8lui8Qs_-F-ICdebsbMd9ku7ALyKvYOUfFicoqPWdgnOdnWK3h_u32ZPxfzl8Xl2Ny8c52ooJCGsFNkw11SqxtRNq5jONkFxwRhlhtcG2lo0kjhGhODGlFoSCw3Vjmo-RVejbj79vYY0VEufHHSdDdCvU8W0oPl98j8oORWlLDN4PYIu9ilFaKtVzN_FTUVJtQ27oqYaw87s5U7U5tS6NofkfNovcMq4VjJjFyPmAWA_3Wn8AWz7hfs</recordid><startdate>19960401</startdate><enddate>19960401</enddate><creator>Arpaia, P.</creator><creator>Cennamo, F.</creator><creator>Daponte, P.</creator><creator>D'Apuzzo, P.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>7U5</scope></search><sort><creationdate>19960401</creationdate><title>Performance enhancement of scan converter-based transient digitizers by digital image processing</title><author>Arpaia, P. ; Cennamo, F. ; Daponte, P. ; D'Apuzzo, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-60024555738167d9bdf728000e735221293b9efb5d60c20553994860aed18c183</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Applied sciences</topic><topic>Detectors</topic><topic>Digital filters</topic><topic>Digital images</topic><topic>Electron beams</topic><topic>Exact sciences and technology</topic><topic>Filtering algorithms</topic><topic>Image converters</topic><topic>Information, signal and communications theory</topic><topic>Sampling, quantization</topic><topic>Semiconductor diodes</topic><topic>Signal and communications theory</topic><topic>Telecommunications and information theory</topic><topic>Testing</topic><topic>Two dimensional displays</topic><topic>Writing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Arpaia, P.</creatorcontrib><creatorcontrib>Cennamo, F.</creatorcontrib><creatorcontrib>Daponte, P.</creatorcontrib><creatorcontrib>D'Apuzzo, P.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Solid State and Superconductivity Abstracts</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Arpaia, P.</au><au>Cennamo, F.</au><au>Daponte, P.</au><au>D'Apuzzo, P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Performance enhancement of scan converter-based transient digitizers by digital image processing</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1996-04-01</date><risdate>1996</risdate><volume>45</volume><issue>2</issue><spage>422</spage><epage>425</epage><pages>422-425</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>A method for the enhancement of dynamic performance of scan converter-based transient digitizers is proposed. First, a technique for discriminating the best diode target region is illustrated. Then, by considering the digitized charge distribution on the target as a digital image, a filtering algorithm capable of recovering trace discontinuities is shown. Results of tests carried out on an actual digitizer are reported.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/19.492759</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9456
ispartof IEEE transactions on instrumentation and measurement, 1996-04, Vol.45 (2), p.422-425
issn 0018-9456
1557-9662
language eng
recordid cdi_proquest_miscellaneous_28514560
source IEEE Electronic Library (IEL)
subjects Applied sciences
Detectors
Digital filters
Digital images
Electron beams
Exact sciences and technology
Filtering algorithms
Image converters
Information, signal and communications theory
Sampling, quantization
Semiconductor diodes
Signal and communications theory
Telecommunications and information theory
Testing
Two dimensional displays
Writing
title Performance enhancement of scan converter-based transient digitizers by digital image processing
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T17%3A49%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Performance%20enhancement%20of%20scan%20converter-based%20transient%20digitizers%20by%20digital%20image%20processing&rft.jtitle=IEEE%20transactions%20on%20instrumentation%20and%20measurement&rft.au=Arpaia,%20P.&rft.date=1996-04-01&rft.volume=45&rft.issue=2&rft.spage=422&rft.epage=425&rft.pages=422-425&rft.issn=0018-9456&rft.eissn=1557-9662&rft.coden=IEIMAO&rft_id=info:doi/10.1109/19.492759&rft_dat=%3Cproquest_RIE%3E28514560%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26315464&rft_id=info:pmid/&rft_ieee_id=492759&rfr_iscdi=true