New realization of the ohm and farad using the NBS calculable capacitor
Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, Omega /sub NBS/ at th...
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| Veröffentlicht in: | IEEE transactions on instrumentation and measurement 1989-04, Vol.38 (2), p.249-251 |
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| container_title | IEEE transactions on instrumentation and measurement |
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| creator | Shields, J.Q. Dziuba, R.F. Layer, H.P. |
| description | Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, Omega /sub NBS/ at the rate of -0.054 p.p.m./year and F/sub NBS/ at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1 sigma ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1 sigma ).< > |
| doi_str_mv | 10.1109/19.192281 |
| format | Article |
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The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, Omega /sub NBS/ at the rate of -0.054 p.p.m./year and F/sub NBS/ at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1 sigma ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1 sigma ).< ></description><identifier>ISSN: 0018-9456</identifier><identifier>EISSN: 1557-9662</identifier><identifier>DOI: 10.1109/19.192281</identifier><identifier>CODEN: IEIMAO</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bridge circuits ; Capacitance ; Capacitors ; Electric resistance ; Electrical resistance measurement ; Frequency measurement ; Laboratories ; NIST ; Resistors ; Uncertainty</subject><ispartof>IEEE transactions on instrumentation and measurement, 1989-04, Vol.38 (2), p.249-251</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c312t-b2db1a5ae82225beb1897dd90e2fbeaa84703a4522d3102d01c521b358c6d0063</citedby><cites>FETCH-LOGICAL-c312t-b2db1a5ae82225beb1897dd90e2fbeaa84703a4522d3102d01c521b358c6d0063</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/192281$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/192281$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Shields, J.Q.</creatorcontrib><creatorcontrib>Dziuba, R.F.</creatorcontrib><creatorcontrib>Layer, H.P.</creatorcontrib><title>New realization of the ohm and farad using the NBS calculable capacitor</title><title>IEEE transactions on instrumentation and measurement</title><addtitle>TIM</addtitle><description>Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, Omega /sub NBS/ at the rate of -0.054 p.p.m./year and F/sub NBS/ at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1 sigma ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1 sigma ).< ></description><subject>Bridge circuits</subject><subject>Capacitance</subject><subject>Capacitors</subject><subject>Electric resistance</subject><subject>Electrical resistance measurement</subject><subject>Frequency measurement</subject><subject>Laboratories</subject><subject>NIST</subject><subject>Resistors</subject><subject>Uncertainty</subject><issn>0018-9456</issn><issn>1557-9662</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1989</creationdate><recordtype>article</recordtype><recordid>eNpF0MFKw0AQBuBFFKzVg1dPexI8pM5sskn2qEWrUOpBPYfJ7sRG0qTuJog-va0RhIEZZj7m8AtxjjBDBHONZoZGqRwPxAS1ziKTpupQTAAwj0yi02NxEsI7AGRpkk3EYsWf0jM19Tf1ddfKrpL9mmW33khqnazIk5NDqNu33_3q9llaauzQUNnwbtySrfvOn4qjiprAZ399Kl7v717mD9HyafE4v1lGNkbVR6VyJZImzpVSuuQSc5M5Z4BVVTJRnmQQU6KVcjGCcoBWKyxjndvUAaTxVFyOf7e--xg49MWmDpabhlruhlCoXEOqdbyDVyO0vgvBc1Vsfb0h_1UgFPuoCtzXPqqdvRhtzcz_bjz-ACwNYl0</recordid><startdate>19890401</startdate><enddate>19890401</enddate><creator>Shields, J.Q.</creator><creator>Dziuba, R.F.</creator><creator>Layer, H.P.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19890401</creationdate><title>New realization of the ohm and farad using the NBS calculable capacitor</title><author>Shields, J.Q. ; Dziuba, R.F. ; Layer, H.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c312t-b2db1a5ae82225beb1897dd90e2fbeaa84703a4522d3102d01c521b358c6d0063</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1989</creationdate><topic>Bridge circuits</topic><topic>Capacitance</topic><topic>Capacitors</topic><topic>Electric resistance</topic><topic>Electrical resistance measurement</topic><topic>Frequency measurement</topic><topic>Laboratories</topic><topic>NIST</topic><topic>Resistors</topic><topic>Uncertainty</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shields, J.Q.</creatorcontrib><creatorcontrib>Dziuba, R.F.</creatorcontrib><creatorcontrib>Layer, H.P.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on instrumentation and measurement</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shields, J.Q.</au><au>Dziuba, R.F.</au><au>Layer, H.P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>New realization of the ohm and farad using the NBS calculable capacitor</atitle><jtitle>IEEE transactions on instrumentation and measurement</jtitle><stitle>TIM</stitle><date>1989-04-01</date><risdate>1989</risdate><volume>38</volume><issue>2</issue><spage>249</spage><epage>251</epage><pages>249-251</pages><issn>0018-9456</issn><eissn>1557-9662</eissn><coden>IEIMAO</coden><abstract>Results of a realization of the ohm and farad using the US National Bureau of Standards (NBS) calculable capacitor and associated apparatus are reported. The results show that both the NBS representation of the ohm and the NBS representation of the farad are changing with time, Omega /sub NBS/ at the rate of -0.054 p.p.m./year and F/sub NBS/ at the rate of 0.010 p.p.m./year. The realization of the ohm is of particular significance because of its role in assigning an SI value to the quantized Hall resistance. The estimated uncertainty of the ohm realization is 0.022 p.p.m. (1 sigma ), while the estimated uncertainty of the farad realization is 0.014 p.p.m. (1 sigma ).< ></abstract><pub>IEEE</pub><doi>10.1109/19.192281</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
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| ispartof | IEEE transactions on instrumentation and measurement, 1989-04, Vol.38 (2), p.249-251 |
| issn | 0018-9456 1557-9662 |
| language | eng |
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| source | IEEE Electronic Library Online |
| subjects | Bridge circuits Capacitance Capacitors Electric resistance Electrical resistance measurement Frequency measurement Laboratories NIST Resistors Uncertainty |
| title | New realization of the ohm and farad using the NBS calculable capacitor |
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