ZnO:Ga Thin Films Produced by RF Sputtering at Room Temperature: Effect of the Power Density
Ga-doped polycrystalline zinc oxide (GZO) thin films have been deposited at high growth rates by rf magnetron sputtering. The dependence of electrical, optical and morphological properties on the rf power density were investigated. The lowest resistivity of 1.9 x 10-4 *Wcm was obtained for a rf powe...
Gespeichert in:
Veröffentlicht in: | Materials science forum 2004-01, Vol.455-456, p.12-15 |
---|---|
Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Schreiben Sie den ersten Kommentar!