Characterizations of undoped and Cu doped CdS thin films using photothermal and other techniques

Photothermal Deflection Spectroscopy (PDS) technique was used to study undoped and copper (Cu) doped cadmium sulphide (CdS) thin films. Variation in grain size and lattice strain due to Cu doping were analysed using X‐ray diffraction (XRD). Changes in mobility of carriers in CdS with Cu concentratio...

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Veröffentlicht in:	Physica status solidi. A, Applications and materials science Applications and materials science, 2005-02, Vol.202 (3), p.425-434
Hauptverfasser:	Paulraj, M., Ramkumar, S., Varkey, K. P., Vijayakumar, K. P., Sudha Kartha, C., Nair, K. G. M.
Format:	Artikel
Sprache:	eng
Schlagworte:	61.10.Nz 78.20.Ci 79.60.Dp 82.80.Kq Exact sciences and technology Physics
Online-Zugang:	Volltext
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