Noise characteristics of YBCO c-axis microbridge junctions

We present measurements of the noise properties of YBCO c-axis Microbridge (CAM) Junctions. The junctions have been characterised in terms of their electrical and noise properties over range of temperature and frequency. The methods used provide both very high sensitivity measurements in a narrow fr...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 1997-06, Vol.7 (2), p.3335-3338
Hauptverfasser:	Henrici, T.G., Ling Hao, Macfarlane, J.C., Pegrum, C.M., Goodyear, S.W., Satchell, J.S., Humphreys, R.G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences CADCAM Computer aided manufacturing Electrical resistance measurement Electronics Exact sciences and technology Fluctuations Frequency measurement Grain boundaries Noise measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting devices Temperature distribution Temperature sensors Yttrium barium copper oxide
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