Noise characteristics of YBCO c-axis microbridge junctions
We present measurements of the noise properties of YBCO c-axis Microbridge (CAM) Junctions. The junctions have been characterised in terms of their electrical and noise properties over range of temperature and frequency. The methods used provide both very high sensitivity measurements in a narrow fr...
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| Veröffentlicht in: | IEEE transactions on applied superconductivity 1997-06, Vol.7 (2), p.3335-3338 |
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| container_title | IEEE transactions on applied superconductivity |
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| creator | Henrici, T.G. Ling Hao Macfarlane, J.C. Pegrum, C.M. Goodyear, S.W. Satchell, J.S. Humphreys, R.G. |
| description | We present measurements of the noise properties of YBCO c-axis Microbridge (CAM) Junctions. The junctions have been characterised in terms of their electrical and noise properties over range of temperature and frequency. The methods used provide both very high sensitivity measurements in a narrow frequency band (60 kHz), and moderate sensitivity measurements in a broad band (0.01-10 kHz). The normalised levels of critical current fluctuations and normal resistance fluctuations are found to be comparable to earlier measurements carried out on grain boundary junctions at both 100 Hz and 60 kHz. The 60 kHz results can be modelled reasonably successfully with the same model developed to describe grain boundary junctions. The frequency dependence is close to 1/f, but has some Lorentzian shaped deviations appearing for many of the junctions examined. These structures are both temperature and bias current dependent. |
| doi_str_mv | 10.1109/77.622078 |
| format | Article |
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The junctions have been characterised in terms of their electrical and noise properties over range of temperature and frequency. The methods used provide both very high sensitivity measurements in a narrow frequency band (60 kHz), and moderate sensitivity measurements in a broad band (0.01-10 kHz). The normalised levels of critical current fluctuations and normal resistance fluctuations are found to be comparable to earlier measurements carried out on grain boundary junctions at both 100 Hz and 60 kHz. The 60 kHz results can be modelled reasonably successfully with the same model developed to describe grain boundary junctions. The frequency dependence is close to 1/f, but has some Lorentzian shaped deviations appearing for many of the junctions examined. These structures are both temperature and bias current dependent.</description><identifier>ISSN: 1051-8223</identifier><identifier>EISSN: 1558-2515</identifier><identifier>DOI: 10.1109/77.622078</identifier><identifier>CODEN: ITASE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; CADCAM ; Computer aided manufacturing ; Electrical resistance measurement ; Electronics ; Exact sciences and technology ; Fluctuations ; Frequency measurement ; Grain boundaries ; Noise measurement ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Superconducting devices ; Temperature distribution ; Temperature sensors ; Yttrium barium copper oxide</subject><ispartof>IEEE transactions on applied superconductivity, 1997-06, Vol.7 (2), p.3335-3338</ispartof><rights>1997 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c306t-9c76882367df918011c9134178cad1cfe2052f2e472db7932374cb842744540e3</citedby><cites>FETCH-LOGICAL-c306t-9c76882367df918011c9134178cad1cfe2052f2e472db7932374cb842744540e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/622078$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,777,781,786,787,793,23911,23912,25121,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/622078$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2820787$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Henrici, T.G.</creatorcontrib><creatorcontrib>Ling Hao</creatorcontrib><creatorcontrib>Macfarlane, J.C.</creatorcontrib><creatorcontrib>Pegrum, C.M.</creatorcontrib><creatorcontrib>Goodyear, S.W.</creatorcontrib><creatorcontrib>Satchell, J.S.</creatorcontrib><creatorcontrib>Humphreys, R.G.</creatorcontrib><title>Noise characteristics of YBCO c-axis microbridge junctions</title><title>IEEE transactions on applied superconductivity</title><addtitle>TASC</addtitle><description>We present measurements of the noise properties of YBCO c-axis Microbridge (CAM) Junctions. The junctions have been characterised in terms of their electrical and noise properties over range of temperature and frequency. The methods used provide both very high sensitivity measurements in a narrow frequency band (60 kHz), and moderate sensitivity measurements in a broad band (0.01-10 kHz). The normalised levels of critical current fluctuations and normal resistance fluctuations are found to be comparable to earlier measurements carried out on grain boundary junctions at both 100 Hz and 60 kHz. The 60 kHz results can be modelled reasonably successfully with the same model developed to describe grain boundary junctions. The frequency dependence is close to 1/f, but has some Lorentzian shaped deviations appearing for many of the junctions examined. These structures are both temperature and bias current dependent.</description><subject>Applied sciences</subject><subject>CADCAM</subject><subject>Computer aided manufacturing</subject><subject>Electrical resistance measurement</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fluctuations</subject><subject>Frequency measurement</subject><subject>Grain boundaries</subject><subject>Noise measurement</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Superconducting devices</subject><subject>Temperature distribution</subject><subject>Temperature sensors</subject><subject>Yttrium barium copper oxide</subject><issn>1051-8223</issn><issn>1558-2515</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9kD1PwzAQhi0EEqUwsDJlQEgMKfbZjh02WvElVXSBgSlyLw64SpPiSyX496RK1elOuuce3b2MXQo-EYLnd8ZMMgBu7BEbCa1tClro477nWqQWQJ6yM6IV50JZpUfs_q0N5BP8dtFh52OgLiAlbZV8TmeLBFP3GyhZB4ztMobyyyerbYNdaBs6ZyeVq8lf7OuYfTw9vs9e0vni-XX2ME9R8qxLczSZtSAzU1a5sFwIzIVUwlh0pcDKA9dQgVcGyqXJJUijcGkVGKW04l6O2c3g3cT2Z-upK9aB0Ne1a3y7pQKsyvrPoAdvB7A_lij6qtjEsHbxrxC82KVTGFMM6fTs9V7qCF1dRddgoMMC2B1leuxqwIL3_jDdO_4Bcxtpog</recordid><startdate>19970601</startdate><enddate>19970601</enddate><creator>Henrici, T.G.</creator><creator>Ling Hao</creator><creator>Macfarlane, J.C.</creator><creator>Pegrum, C.M.</creator><creator>Goodyear, S.W.</creator><creator>Satchell, J.S.</creator><creator>Humphreys, R.G.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19970601</creationdate><title>Noise characteristics of YBCO c-axis microbridge junctions</title><author>Henrici, T.G. ; Ling Hao ; Macfarlane, J.C. ; Pegrum, C.M. ; Goodyear, S.W. ; Satchell, J.S. ; Humphreys, R.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c306t-9c76882367df918011c9134178cad1cfe2052f2e472db7932374cb842744540e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Applied sciences</topic><topic>CADCAM</topic><topic>Computer aided manufacturing</topic><topic>Electrical resistance measurement</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fluctuations</topic><topic>Frequency measurement</topic><topic>Grain boundaries</topic><topic>Noise measurement</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Superconducting devices</topic><topic>Temperature distribution</topic><topic>Temperature sensors</topic><topic>Yttrium barium copper oxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Henrici, T.G.</creatorcontrib><creatorcontrib>Ling Hao</creatorcontrib><creatorcontrib>Macfarlane, J.C.</creatorcontrib><creatorcontrib>Pegrum, C.M.</creatorcontrib><creatorcontrib>Goodyear, S.W.</creatorcontrib><creatorcontrib>Satchell, J.S.</creatorcontrib><creatorcontrib>Humphreys, R.G.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on applied superconductivity</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Henrici, T.G.</au><au>Ling Hao</au><au>Macfarlane, J.C.</au><au>Pegrum, C.M.</au><au>Goodyear, S.W.</au><au>Satchell, J.S.</au><au>Humphreys, R.G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Noise characteristics of YBCO c-axis microbridge junctions</atitle><jtitle>IEEE transactions on applied superconductivity</jtitle><stitle>TASC</stitle><date>1997-06-01</date><risdate>1997</risdate><volume>7</volume><issue>2</issue><spage>3335</spage><epage>3338</epage><pages>3335-3338</pages><issn>1051-8223</issn><eissn>1558-2515</eissn><coden>ITASE9</coden><abstract>We present measurements of the noise properties of YBCO c-axis Microbridge (CAM) Junctions. The junctions have been characterised in terms of their electrical and noise properties over range of temperature and frequency. The methods used provide both very high sensitivity measurements in a narrow frequency band (60 kHz), and moderate sensitivity measurements in a broad band (0.01-10 kHz). The normalised levels of critical current fluctuations and normal resistance fluctuations are found to be comparable to earlier measurements carried out on grain boundary junctions at both 100 Hz and 60 kHz. The 60 kHz results can be modelled reasonably successfully with the same model developed to describe grain boundary junctions. The frequency dependence is close to 1/f, but has some Lorentzian shaped deviations appearing for many of the junctions examined. These structures are both temperature and bias current dependent.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/77.622078</doi><tpages>4</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Applied sciences CADCAM Computer aided manufacturing Electrical resistance measurement Electronics Exact sciences and technology Fluctuations Frequency measurement Grain boundaries Noise measurement Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Superconducting devices Temperature distribution Temperature sensors Yttrium barium copper oxide |
| title | Noise characteristics of YBCO c-axis microbridge junctions |
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