Energy storage capacitors: aging, and diagnostic approaches for life validation

Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analys...

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Veröffentlicht in:IEEE Transactions on Magnetics 1997-01, Vol.33 (1), p.501-506
Hauptverfasser: Sarjeant, W.J., MacDougall, F.W., Larson, D.W., Kohlberg, I.
Format: Artikel
Sprache:eng
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Zusammenfassung:Over the last decade, significant increases in capacitor reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high energy pulse applications. Recent innovations in analysis of aging, including dimensional analysis, are introduced for predicting component performance and fault tolerance. In addition, voltage scaling issues that may drive bank fault-tolerance performance are described.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.560063