Near-infrared refractive index of thick, laterally oxidized AlGaAs cladding layers
The optical transmission in the range 900-1600 nm was measured through thick (/spl sim/1 /spl mu/m) layers of Al/sub 0.98/Ga/sub 0.02/As wet-oxidized at 375/spl deg/C on GaAs. The spectra are fit well by neglecting absorption, and using 1.61 for the refractive index.
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| Veröffentlicht in: | Journal of lightwave technology 2000-02, Vol.18 (2), p.199-202 |
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| container_end_page | 202 |
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| container_issue | 2 |
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| container_title | Journal of lightwave technology |
| container_volume | 18 |
| creator | Sfigakis, F. Paddon, P. Pacradouni, V. Adamcyk, M. Nicoll, C. Cowan, A.R. Tiedje, T. Young, J.F. |
| description | The optical transmission in the range 900-1600 nm was measured through thick (/spl sim/1 /spl mu/m) layers of Al/sub 0.98/Ga/sub 0.02/As wet-oxidized at 375/spl deg/C on GaAs. The spectra are fit well by neglecting absorption, and using 1.61 for the refractive index. |
| doi_str_mv | 10.1109/50.822793 |
| format | Article |
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The spectra are fit well by neglecting absorption, and using 1.61 for the refractive index.</description><identifier>ISSN: 0733-8724</identifier><identifier>EISSN: 1558-2213</identifier><identifier>DOI: 10.1109/50.822793</identifier><identifier>CODEN: JLTEDG</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Aluminum gallium arsenides ; Applied sciences ; Cladding ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Dielectric substrates ; Electronics ; Exact sciences and technology ; Gallium arsenide ; Gallium arsenides ; Materials ; Molecular beam epitaxial growth ; Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of bulk materials and thin films ; Optical refraction ; Optical variables control ; Optical waveguides ; Oxidation ; Photonic crystals ; Physics ; Refractive index ; Refractivity ; Spectra ; Vertical cavity surface emitting lasers</subject><ispartof>Journal of lightwave technology, 2000-02, Vol.18 (2), p.199-202</ispartof><rights>2000 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2000</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c460t-978494ee746078998df030af2b8ebc2e649f7241842028511b8dcff81f075cc43</citedby><cites>FETCH-LOGICAL-c460t-978494ee746078998df030af2b8ebc2e649f7241842028511b8dcff81f075cc43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/822793$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/822793$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=1280049$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Sfigakis, F.</creatorcontrib><creatorcontrib>Paddon, P.</creatorcontrib><creatorcontrib>Pacradouni, V.</creatorcontrib><creatorcontrib>Adamcyk, M.</creatorcontrib><creatorcontrib>Nicoll, C.</creatorcontrib><creatorcontrib>Cowan, A.R.</creatorcontrib><creatorcontrib>Tiedje, T.</creatorcontrib><creatorcontrib>Young, J.F.</creatorcontrib><title>Near-infrared refractive index of thick, laterally oxidized AlGaAs cladding layers</title><title>Journal of lightwave technology</title><addtitle>JLT</addtitle><description>The optical transmission in the range 900-1600 nm was measured through thick (/spl sim/1 /spl mu/m) layers of Al/sub 0.98/Ga/sub 0.02/As wet-oxidized at 375/spl deg/C on GaAs. The spectra are fit well by neglecting absorption, and using 1.61 for the refractive index.</description><subject>Aluminum gallium arsenides</subject><subject>Applied sciences</subject><subject>Cladding</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Dielectric substrates</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Gallium arsenide</subject><subject>Gallium arsenides</subject><subject>Materials</subject><subject>Molecular beam epitaxial growth</subject><subject>Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of bulk materials and thin films</subject><subject>Optical refraction</subject><subject>Optical variables control</subject><subject>Optical waveguides</subject><subject>Oxidation</subject><subject>Photonic crystals</subject><subject>Physics</subject><subject>Refractive index</subject><subject>Refractivity</subject><subject>Spectra</subject><subject>Vertical cavity surface emitting lasers</subject><issn>0733-8724</issn><issn>1558-2213</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0s9rFDEUB_BQFLq2HnrtaRBRC5325U0ySY5LaatQKoieh2zmRVPTmZrMSrd_vVl2qeCh9pIf5JMvyUsYO-BwwjmYUwknGlGZZofNuJS6RuTNCzYD1TS1Vih22aucbwC4EFrN2JdrsqkOg082UV8lKgM3hd9UhaGn-2r01fQjuJ_HVbQTJRvjqhrvQx8eip7HSzvPlYu278PwvZAVpbzPXnobM73e9nvs28X517OP9dXny09n86vaiRam2igtjCBSZaa0Mbr30ID1uNC0cEitML6cl2uBgFpyvtC9815zD0o6J5o99n6Te5fGX0vKU3cbsqMY7UDjMneGi1ZgaYp896RErdoWDD4DihKHzf-hakv1cZ344UnIAVEbCYYX-uYfejMu01BK2GktAaVR60sfbZBLY87lubq7FG5tWpWkbv0DOgnd5gcU-3YbaLOzsbzs4EL-uwE1gDCFHW5YIKLH1W3GH93ttJA</recordid><startdate>20000201</startdate><enddate>20000201</enddate><creator>Sfigakis, F.</creator><creator>Paddon, P.</creator><creator>Pacradouni, V.</creator><creator>Adamcyk, M.</creator><creator>Nicoll, C.</creator><creator>Cowan, A.R.</creator><creator>Tiedje, T.</creator><creator>Young, J.F.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| subjects | Aluminum gallium arsenides Applied sciences Cladding Condensed matter: electronic structure, electrical, magnetic, and optical properties Dielectric substrates Electronics Exact sciences and technology Gallium arsenide Gallium arsenides Materials Molecular beam epitaxial growth Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films Optical refraction Optical variables control Optical waveguides Oxidation Photonic crystals Physics Refractive index Refractivity Spectra Vertical cavity surface emitting lasers |
| title | Near-infrared refractive index of thick, laterally oxidized AlGaAs cladding layers |
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