Measured electromagnetic shielding performance of commonly used cables and connectors
The intrinsic electromagnetic property of a cable or connector shield is considered its surface transfer impedance. This is the ratio of the longitudinal open circuit voltage measured on one side of the shield (normally the inside) to the axial current on the other side (normally the outside). In ca...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 1988-08, Vol.30 (3), p.260-275 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 275 |
|---|---|
| container_issue | 3 |
| container_start_page | 260 |
| container_title | IEEE transactions on electromagnetic compatibility |
| container_volume | 30 |
| creator | Hoeft, L.O. Hofstra, J.S. |
| description | The intrinsic electromagnetic property of a cable or connector shield is considered its surface transfer impedance. This is the ratio of the longitudinal open circuit voltage measured on one side of the shield (normally the inside) to the axial current on the other side (normally the outside). In cases where a high electric field is present at the surface of the shield, the transfer admittance or charge transfer elastance is also important. Measurements of typical cables, connectors, backshells, and cable terminations are presented and explained in terms of simple models.< > |
| doi_str_mv | 10.1109/15.3304 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28433939</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>3304</ieee_id><sourcerecordid>24955472</sourcerecordid><originalsourceid>FETCH-LOGICAL-c331t-19c54273f9690872b68ec5ddf4b543953616bffaa4c6e6308e0c4fe8bcf89c4b3</originalsourceid><addsrcrecordid>eNqFkD1PwzAQhi0EEqUgVsYMCKYUO7YTe0RV-ZCKWKjEFjnOuQQ5drGTof8el1ZdkYfz6Z57pHsRuiZ4RgiWD4TPKMXsBE0I5yInovo8RROMicglrfg5uojxO7WMF3SCVm-g4higzcCCHoLv1drB0OksfnVg286tsw0E40OvnIbMm0z7vvfObrMxpjWtGgsxUy59vXPJ4UO8RGdG2QhXhzpFq6fFx_wlX74_v84fl7mmlAw5kZqzoqJGlhKLqmhKAZq3rWENZ1RyWpKyMUYppksoKRaANTMgGm2E1KyhU3S3926C_xkhDnXfRQ3WKgd-jHUhGKUyvX9BJjlnVZHA-z2og48xgKk3oetV2NYE17t8a8LrXb6JvD0oVdTKmpDy6eIRr2iKON02RTd7rAOA4_TP8Autc4Js</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>24955472</pqid></control><display><type>article</type><title>Measured electromagnetic shielding performance of commonly used cables and connectors</title><source>IEEE Electronic Library (IEL)</source><creator>Hoeft, L.O. ; Hofstra, J.S.</creator><creatorcontrib>Hoeft, L.O. ; Hofstra, J.S.</creatorcontrib><description>The intrinsic electromagnetic property of a cable or connector shield is considered its surface transfer impedance. This is the ratio of the longitudinal open circuit voltage measured on one side of the shield (normally the inside) to the axial current on the other side (normally the outside). In cases where a high electric field is present at the surface of the shield, the transfer admittance or charge transfer elastance is also important. Measurements of typical cables, connectors, backshells, and cable terminations are presented and explained in terms of simple models.< ></description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/15.3304</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Admittance ; Applied sciences ; Cable shielding ; Charge transfer ; Circuits ; Connectors ; Current measurement ; Electromagnetic compatibility ; Electromagnetic measurements ; Electromagnetic shielding ; Exact sciences and technology ; Information, signal and communications theory ; Surface impedance ; Telecommunications and information theory ; Voltage measurement</subject><ispartof>IEEE transactions on electromagnetic compatibility, 1988-08, Vol.30 (3), p.260-275</ispartof><rights>1989 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c331t-19c54273f9690872b68ec5ddf4b543953616bffaa4c6e6308e0c4fe8bcf89c4b3</citedby><cites>FETCH-LOGICAL-c331t-19c54273f9690872b68ec5ddf4b543953616bffaa4c6e6308e0c4fe8bcf89c4b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/3304$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/3304$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7301427$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Hoeft, L.O.</creatorcontrib><creatorcontrib>Hofstra, J.S.</creatorcontrib><title>Measured electromagnetic shielding performance of commonly used cables and connectors</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>The intrinsic electromagnetic property of a cable or connector shield is considered its surface transfer impedance. This is the ratio of the longitudinal open circuit voltage measured on one side of the shield (normally the inside) to the axial current on the other side (normally the outside). In cases where a high electric field is present at the surface of the shield, the transfer admittance or charge transfer elastance is also important. Measurements of typical cables, connectors, backshells, and cable terminations are presented and explained in terms of simple models.< ></description><subject>Admittance</subject><subject>Applied sciences</subject><subject>Cable shielding</subject><subject>Charge transfer</subject><subject>Circuits</subject><subject>Connectors</subject><subject>Current measurement</subject><subject>Electromagnetic compatibility</subject><subject>Electromagnetic measurements</subject><subject>Electromagnetic shielding</subject><subject>Exact sciences and technology</subject><subject>Information, signal and communications theory</subject><subject>Surface impedance</subject><subject>Telecommunications and information theory</subject><subject>Voltage measurement</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1988</creationdate><recordtype>article</recordtype><recordid>eNqFkD1PwzAQhi0EEqUgVsYMCKYUO7YTe0RV-ZCKWKjEFjnOuQQ5drGTof8el1ZdkYfz6Z57pHsRuiZ4RgiWD4TPKMXsBE0I5yInovo8RROMicglrfg5uojxO7WMF3SCVm-g4higzcCCHoLv1drB0OksfnVg286tsw0E40OvnIbMm0z7vvfObrMxpjWtGgsxUy59vXPJ4UO8RGdG2QhXhzpFq6fFx_wlX74_v84fl7mmlAw5kZqzoqJGlhKLqmhKAZq3rWENZ1RyWpKyMUYppksoKRaANTMgGm2E1KyhU3S3926C_xkhDnXfRQ3WKgd-jHUhGKUyvX9BJjlnVZHA-z2og48xgKk3oetV2NYE17t8a8LrXb6JvD0oVdTKmpDy6eIRr2iKON02RTd7rAOA4_TP8Autc4Js</recordid><startdate>19880801</startdate><enddate>19880801</enddate><creator>Hoeft, L.O.</creator><creator>Hofstra, J.S.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19880801</creationdate><title>Measured electromagnetic shielding performance of commonly used cables and connectors</title><author>Hoeft, L.O. ; Hofstra, J.S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c331t-19c54273f9690872b68ec5ddf4b543953616bffaa4c6e6308e0c4fe8bcf89c4b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1988</creationdate><topic>Admittance</topic><topic>Applied sciences</topic><topic>Cable shielding</topic><topic>Charge transfer</topic><topic>Circuits</topic><topic>Connectors</topic><topic>Current measurement</topic><topic>Electromagnetic compatibility</topic><topic>Electromagnetic measurements</topic><topic>Electromagnetic shielding</topic><topic>Exact sciences and technology</topic><topic>Information, signal and communications theory</topic><topic>Surface impedance</topic><topic>Telecommunications and information theory</topic><topic>Voltage measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Hoeft, L.O.</creatorcontrib><creatorcontrib>Hofstra, J.S.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hoeft, L.O.</au><au>Hofstra, J.S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measured electromagnetic shielding performance of commonly used cables and connectors</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>1988-08-01</date><risdate>1988</risdate><volume>30</volume><issue>3</issue><spage>260</spage><epage>275</epage><pages>260-275</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>The intrinsic electromagnetic property of a cable or connector shield is considered its surface transfer impedance. This is the ratio of the longitudinal open circuit voltage measured on one side of the shield (normally the inside) to the axial current on the other side (normally the outside). In cases where a high electric field is present at the surface of the shield, the transfer admittance or charge transfer elastance is also important. Measurements of typical cables, connectors, backshells, and cable terminations are presented and explained in terms of simple models.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/15.3304</doi><tpages>16</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0018-9375 |
| ispartof | IEEE transactions on electromagnetic compatibility, 1988-08, Vol.30 (3), p.260-275 |
| issn | 0018-9375 1558-187X |
| language | eng |
| recordid | cdi_proquest_miscellaneous_28433939 |
| source | IEEE Electronic Library (IEL) |
| subjects | Admittance Applied sciences Cable shielding Charge transfer Circuits Connectors Current measurement Electromagnetic compatibility Electromagnetic measurements Electromagnetic shielding Exact sciences and technology Information, signal and communications theory Surface impedance Telecommunications and information theory Voltage measurement |
| title | Measured electromagnetic shielding performance of commonly used cables and connectors |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T15%3A57%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measured%20electromagnetic%20shielding%20performance%20of%20commonly%20used%20cables%20and%20connectors&rft.jtitle=IEEE%20transactions%20on%20electromagnetic%20compatibility&rft.au=Hoeft,%20L.O.&rft.date=1988-08-01&rft.volume=30&rft.issue=3&rft.spage=260&rft.epage=275&rft.pages=260-275&rft.issn=0018-9375&rft.eissn=1558-187X&rft.coden=IEMCAE&rft_id=info:doi/10.1109/15.3304&rft_dat=%3Cproquest_RIE%3E24955472%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=24955472&rft_id=info:pmid/&rft_ieee_id=3304&rfr_iscdi=true |