Scanning transmission electron microscopy (STEM)–transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel
The microstructure of nitrogen implanted AISI 302 austenitic stainless steel and the effect of long-term room temperature ageing on it have been studied. Samples were implanted in 1992 with 2.5×10 21 N 2 + m −2 at 130 keV. The characteristics of the implanted layer and the depth profile have been in...
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| Veröffentlicht in: | Thin solid films 2004, Vol.446 (1), p.12-17 |
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| creator | Aggarwal, Sanjeev Goodhew, Peter J Murray, R.T |
| description | The microstructure of nitrogen implanted AISI 302 austenitic stainless steel and the effect of long-term room temperature ageing on it have been studied. Samples were implanted in 1992 with 2.5×10
21 N
2
+
m
−2 at 130 keV. The characteristics of the implanted layer and the depth profile have been investigated by scanning transmission electron microscope combined with energy dispersive X-ray spectrometry. Electron diffraction patterns recorded in the implanted layer using transmission electron microscopy confirm the formation of CrN along with the presence of Cr
2N. The identification of phases by glancing angle X-ray diffraction also indicates the formation of Cr
2N and nitrogen solid solutions. The effects of ageing on the microstructure are observed to be small. |
| doi_str_mv | 10.1016/S0040-6090(03)01233-1 |
| format | Article |
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21 N
2
+
m
−2 at 130 keV. The characteristics of the implanted layer and the depth profile have been investigated by scanning transmission electron microscope combined with energy dispersive X-ray spectrometry. Electron diffraction patterns recorded in the implanted layer using transmission electron microscopy confirm the formation of CrN along with the presence of Cr
2N. The identification of phases by glancing angle X-ray diffraction also indicates the formation of Cr
2N and nitrogen solid solutions. The effects of ageing on the microstructure are observed to be small.</description><identifier>ISSN: 0040-6090</identifier><identifier>EISSN: 1879-2731</identifier><identifier>DOI: 10.1016/S0040-6090(03)01233-1</identifier><identifier>CODEN: THSFAP</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Defects and impurities in crystals; microstructure ; Doping and impurity implantation in other materials ; Electron, ion, and scanning probe microscopy ; Exact sciences and technology ; Glancing angle X-ray diffraction (GXRD) ; Ion implantation ; Nitrogen ; Physics ; Scanning transmission electron microscopy (STEM) ; Structure of solids and liquids; crystallography ; Transmission electron microscopy (TEM) ; Transmission, reflection and scanning electron microscopy(including ebic)</subject><ispartof>Thin solid films, 2004, Vol.446 (1), p.12-17</ispartof><rights>2003 Elsevier B.V.</rights><rights>2004 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c316t-9fda8010e97f1c47893535cc7e71d3596149e538ece807d5ca248f344d512e213</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0040-6090(03)01233-1$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,4024,27923,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15433132$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Aggarwal, Sanjeev</creatorcontrib><creatorcontrib>Goodhew, Peter J</creatorcontrib><creatorcontrib>Murray, R.T</creatorcontrib><title>Scanning transmission electron microscopy (STEM)–transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel</title><title>Thin solid films</title><description>The microstructure of nitrogen implanted AISI 302 austenitic stainless steel and the effect of long-term room temperature ageing on it have been studied. Samples were implanted in 1992 with 2.5×10
21 N
2
+
m
−2 at 130 keV. The characteristics of the implanted layer and the depth profile have been investigated by scanning transmission electron microscope combined with energy dispersive X-ray spectrometry. Electron diffraction patterns recorded in the implanted layer using transmission electron microscopy confirm the formation of CrN along with the presence of Cr
2N. The identification of phases by glancing angle X-ray diffraction also indicates the formation of Cr
2N and nitrogen solid solutions. The effects of ageing on the microstructure are observed to be small.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Defects and impurities in crystals; microstructure</subject><subject>Doping and impurity implantation in other materials</subject><subject>Electron, ion, and scanning probe microscopy</subject><subject>Exact sciences and technology</subject><subject>Glancing angle X-ray diffraction (GXRD)</subject><subject>Ion implantation</subject><subject>Nitrogen</subject><subject>Physics</subject><subject>Scanning transmission electron microscopy (STEM)</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Transmission electron microscopy (TEM)</subject><subject>Transmission, reflection and scanning electron microscopy(including ebic)</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqFkcFO3DAQhi1UJLbAIyD5UgSHlLEn3iSnCiEKlUAcFs6W5UyQq6yzeLJIe-Mdeuzb8SR1WFSOnDySv_Hv__-FOFLwXYGany0ASijm0MAJ4CkojVioHTFTddUUukL1Rcz-I3viK_NvgIxpnIm_C-9iDPFRjslFXgbmMERJPfkx5WEZfBrYD6uNPFncX96evr78-ZycQOmi6zccWA6djCEzjxTltBKWq97FkVrp1jxSvgteImjJowuxJ-Y8EfUHYrdzPdPh-7kvHn5e3l9cFzd3V78uzm8Kj2o-Fk3XuhoUUFN1ypdV3aBB431FlWrRNHNVNmSwJk81VK3xTpd1h2XZGqVJK9wXx9t3V2l4WhOPNpvz1OdP0rBmq2s0UDVlBs0WnJxyos6uUli6tLEK7FSFfavCTjlbQPtWhZ0Evr0LOPau73J-PvDHsikRFerM_dhylN0-B0qWfaDoqQ0pp2zbIXyi9A_HdqC5</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Aggarwal, Sanjeev</creator><creator>Goodhew, Peter J</creator><creator>Murray, R.T</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>2004</creationdate><title>Scanning transmission electron microscopy (STEM)–transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel</title><author>Aggarwal, Sanjeev ; Goodhew, Peter J ; Murray, R.T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-9fda8010e97f1c47893535cc7e71d3596149e538ece807d5ca248f344d512e213</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Defects and impurities in crystals; microstructure</topic><topic>Doping and impurity implantation in other materials</topic><topic>Electron, ion, and scanning probe microscopy</topic><topic>Exact sciences and technology</topic><topic>Glancing angle X-ray diffraction (GXRD)</topic><topic>Ion implantation</topic><topic>Nitrogen</topic><topic>Physics</topic><topic>Scanning transmission electron microscopy (STEM)</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Transmission electron microscopy (TEM)</topic><topic>Transmission, reflection and scanning electron microscopy(including ebic)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Aggarwal, Sanjeev</creatorcontrib><creatorcontrib>Goodhew, Peter J</creatorcontrib><creatorcontrib>Murray, R.T</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Aggarwal, Sanjeev</au><au>Goodhew, Peter J</au><au>Murray, R.T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Scanning transmission electron microscopy (STEM)–transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel</atitle><jtitle>Thin solid films</jtitle><date>2004</date><risdate>2004</risdate><volume>446</volume><issue>1</issue><spage>12</spage><epage>17</epage><pages>12-17</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>The microstructure of nitrogen implanted AISI 302 austenitic stainless steel and the effect of long-term room temperature ageing on it have been studied. Samples were implanted in 1992 with 2.5×10
21 N
2
+
m
−2 at 130 keV. The characteristics of the implanted layer and the depth profile have been investigated by scanning transmission electron microscope combined with energy dispersive X-ray spectrometry. Electron diffraction patterns recorded in the implanted layer using transmission electron microscopy confirm the formation of CrN along with the presence of Cr
2N. The identification of phases by glancing angle X-ray diffraction also indicates the formation of Cr
2N and nitrogen solid solutions. The effects of ageing on the microstructure are observed to be small.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/S0040-6090(03)01233-1</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext |
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| issn | 0040-6090 1879-2731 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_28350794 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Doping and impurity implantation in other materials Electron, ion, and scanning probe microscopy Exact sciences and technology Glancing angle X-ray diffraction (GXRD) Ion implantation Nitrogen Physics Scanning transmission electron microscopy (STEM) Structure of solids and liquids crystallography Transmission electron microscopy (TEM) Transmission, reflection and scanning electron microscopy(including ebic) |
| title | Scanning transmission electron microscopy (STEM)–transmission electron microscopy (TEM) analysis of nitrogen ion implanted austenitic 302 stainless steel |
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