Alpha particle simulation of space radiation damage effects in semiconductor devices

We describe a method that uses an /sup 241/Am alpha particle source to simulate effects of space radiation damage to semiconductor devices. By applying a unique combination of analytic and numerical techniques to data obtained from alpha irradiation experiments, device response to protons and other...

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Veröffentlicht in:	IEEE Transactions on Nuclear Science 1995-12, Vol.42 (6), p.2089-2094
Hauptverfasser:	Colerico, C.W., Serreze, H.B., Messenger, S.R., Xapsos, M.A., Burke, E.A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Alpha particles AMERICIUM 241 ANALYTICAL SOLUTION COMPARATIVE EVALUATIONS Electrons Energy loss EXPERIMENTAL DATA INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS Laboratories NUMERICAL SOLUTION PHYSICAL RADIATION EFFECTS PROBABILISTIC ESTIMATION Protons Satellites SEMICONDUCTOR DEVICES Semiconductor materials SPACE FLIGHT Testing Voltage
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