Low-frequency noise spectroscopy

Electrical noise in excess of thermal and shot noise is caused by imperfections in the device. Its control can improve the quality of the device and its measurement can give considerable information about the nature of the defects involved. For defects with discrete energy distributions spectroscopy...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on electron devices 1994-11, Vol.41 (11), p.2188-2197
1. Verfasser:	Jones, B.K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Dielectric breakdown Electronics Energy measurement Exact sciences and technology Fluctuations Frequency Gaussian noise Low-frequency noise Noise generators Noise level Spectroscopy Testing, measurement, noise and reliability Time domain analysis
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