Investigation of Thick 3C-SiC Films Re-Grown on Thin 35 nm "Flash Lamp Annealed" 3C-SiC Layers
We report on 3 *mm thick 3C-SiC films re-grown on 35 nm thin 3C-SiC layers on Si annealed by a flash lamp process (FLP). Firstly a 35 nm thick 3C-SiC film is deposited on a < 100 > -Si substrate which is followed, secondly, by FLP. This leads to a fast melting (within 20 msec) of the Si-SiC in...
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Veröffentlicht in: | Materials science forum 2004-01, Vol.457-460, p.313-316 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | We report on 3 *mm thick 3C-SiC films re-grown on 35 nm thin 3C-SiC layers on Si annealed by a flash lamp process (FLP). Firstly a 35 nm thick 3C-SiC film is deposited on a < 100 > -Si substrate which is followed, secondly, by FLP. This leads to a fast melting (within 20 msec) of the Si-SiC interface region followed by epitaxial solidification. Then, in a third step, this film is used as a seed for the deposition of a second 3 *mm thick 3C-SiC layer. This newly developed process including FLP is called FLASiC (Flash Lamp Annealed Silicon Carbide). Compared with standard 3 *mm thick layers directly grown on silicon, both transmission electron microscopy and low temperature photoluminescence evidence improvement of the re-grown material. |
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ISSN: | 0255-5476 1662-9752 1662-9752 |
DOI: | 10.4028/www.scientific.net/MSF.457-460.313 |