Investigation of Thick 3C-SiC Films Re-Grown on Thin 35 nm "Flash Lamp Annealed" 3C-SiC Layers

We report on 3 *mm thick 3C-SiC films re-grown on 35 nm thin 3C-SiC layers on Si annealed by a flash lamp process (FLP). Firstly a 35 nm thick 3C-SiC film is deposited on a < 100 > -Si substrate which is followed, secondly, by FLP. This leads to a fast melting (within 20 msec) of the Si-SiC in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Materials science forum 2004-01, Vol.457-460, p.313-316
Hauptverfasser: Camassel, Jean, Polychroniadis, Efstathios K., Panknin, D., Stoemenos, J., Ferro, Gabriel, Balloud, Carole, Skorupa, Wolfgang, Monteil, Yves
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We report on 3 *mm thick 3C-SiC films re-grown on 35 nm thin 3C-SiC layers on Si annealed by a flash lamp process (FLP). Firstly a 35 nm thick 3C-SiC film is deposited on a < 100 > -Si substrate which is followed, secondly, by FLP. This leads to a fast melting (within 20 msec) of the Si-SiC interface region followed by epitaxial solidification. Then, in a third step, this film is used as a seed for the deposition of a second 3 *mm thick 3C-SiC layer. This newly developed process including FLP is called FLASiC (Flash Lamp Annealed Silicon Carbide). Compared with standard 3 *mm thick layers directly grown on silicon, both transmission electron microscopy and low temperature photoluminescence evidence improvement of the re-grown material.
ISSN:0255-5476
1662-9752
1662-9752
DOI:10.4028/www.scientific.net/MSF.457-460.313