Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films
To experimentally determine the mass absorption coefficient ( μ ) of a sp 3 -carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200–800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yiel...
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| Veröffentlicht in: | Analytical sciences 2023-07, Vol.39 (7), p.1089-1096 |
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| creator | Muramatsu, Yasuji Matsumoto, Yuya |
| description | To experimentally determine the mass absorption coefficient (
μ
) of a sp
3
-carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200–800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yield (TEY) modes. PE films were prepared by a spin-coating method. Their experimentally measured thickness and density are 200 nm and 0.920 g/cm
3
, respectively. Soft X-ray absorption measurements were performed in beamline BL-6.3.2 at the Advanced Light Source. Although surface oxygen can be slightly observed in the O K and C K regions in TEY-XAS, it cannot be observed in absorbance-XAS. The absorbance-XAS profiles agree well with the calculated profiles, except in the C K threshold. Hence, it can be confirmed that the absorption-XAS measurements are achieved. From the absorbance,
μ
of sp
3
-C in PE is 7 × 10
4
cm
2
/g near 288 eV and 294 eV.
Graphical abstract |
| doi_str_mv | 10.1007/s44211-023-00318-4 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2829706177</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2829706177</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1644-4183b231b105082dd63f6afce98fb47df8bdc6e4d6f9640030601bf6ce8d295d3</originalsourceid><addsrcrecordid>eNp9kE1u1TAUhSNEJR4tG-jIQyaB6586zhBVQJGKOilMLce-fk2V2ME3GbxZ98AGWEuXwkrw4zFmdHWk7xzpfk1zyeEdB-jek1KC8xaEbAEkN6160ey4VKYVQumXzQ56Dq2WCl41r4keAbgwQuyap6-OiLmBclnWMSfmM8Y4-hHTysbE1gdkAuD3008D8PwLv7OC-yOXI6NFMu_KUJNb80xsRkdbwcA2GtOeEU6xpdWlcExLng64PhwmTFhn63Ycp5kumrPoJsI3_-558-3Tx_vrm_b27vOX6w-3redaqVZxIwch-cDhCowIQcuoXfTYmzioLkQzBK9RBR17raoD0MCHqD2aIPqrIM-bt6fdpeQfG9Jq55E8TpNLmDeyVUffgeZdV1FxQn3JRAWjXco4u3KwHOxRtz3ptlW3_avbqlqSpxJVOO2x2Me8lVRf-l_rD2BmhTo</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2829706177</pqid></control><display><type>article</type><title>Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films</title><source>SpringerNature Journals</source><source>Open Access Titles of Japan</source><source>EZB-FREE-00999 freely available EZB journals</source><creator>Muramatsu, Yasuji ; Matsumoto, Yuya</creator><creatorcontrib>Muramatsu, Yasuji ; Matsumoto, Yuya</creatorcontrib><description>To experimentally determine the mass absorption coefficient (
μ
) of a sp
3
-carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200–800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yield (TEY) modes. PE films were prepared by a spin-coating method. Their experimentally measured thickness and density are 200 nm and 0.920 g/cm
3
, respectively. Soft X-ray absorption measurements were performed in beamline BL-6.3.2 at the Advanced Light Source. Although surface oxygen can be slightly observed in the O K and C K regions in TEY-XAS, it cannot be observed in absorbance-XAS. The absorbance-XAS profiles agree well with the calculated profiles, except in the C K threshold. Hence, it can be confirmed that the absorption-XAS measurements are achieved. From the absorbance,
μ
of sp
3
-C in PE is 7 × 10
4
cm
2
/g near 288 eV and 294 eV.
Graphical abstract</description><identifier>ISSN: 0910-6340</identifier><identifier>EISSN: 1348-2246</identifier><identifier>DOI: 10.1007/s44211-023-00318-4</identifier><language>eng</language><publisher>Singapore: Springer Nature Singapore</publisher><subject>Analytical Chemistry ; Chemistry ; Chemistry and Materials Science ; Original Paper</subject><ispartof>Analytical sciences, 2023-07, Vol.39 (7), p.1089-1096</ispartof><rights>The Author(s), under exclusive licence to The Japan Society for Analytical Chemistry 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1644-4183b231b105082dd63f6afce98fb47df8bdc6e4d6f9640030601bf6ce8d295d3</cites><orcidid>0000-0001-6284-9825</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s44211-023-00318-4$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s44211-023-00318-4$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Muramatsu, Yasuji</creatorcontrib><creatorcontrib>Matsumoto, Yuya</creatorcontrib><title>Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films</title><title>Analytical sciences</title><addtitle>ANAL. SCI</addtitle><description>To experimentally determine the mass absorption coefficient (
μ
) of a sp
3
-carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200–800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yield (TEY) modes. PE films were prepared by a spin-coating method. Their experimentally measured thickness and density are 200 nm and 0.920 g/cm
3
, respectively. Soft X-ray absorption measurements were performed in beamline BL-6.3.2 at the Advanced Light Source. Although surface oxygen can be slightly observed in the O K and C K regions in TEY-XAS, it cannot be observed in absorbance-XAS. The absorbance-XAS profiles agree well with the calculated profiles, except in the C K threshold. Hence, it can be confirmed that the absorption-XAS measurements are achieved. From the absorbance,
μ
of sp
3
-C in PE is 7 × 10
4
cm
2
/g near 288 eV and 294 eV.
Graphical abstract</description><subject>Analytical Chemistry</subject><subject>Chemistry</subject><subject>Chemistry and Materials Science</subject><subject>Original Paper</subject><issn>0910-6340</issn><issn>1348-2246</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNp9kE1u1TAUhSNEJR4tG-jIQyaB6586zhBVQJGKOilMLce-fk2V2ME3GbxZ98AGWEuXwkrw4zFmdHWk7xzpfk1zyeEdB-jek1KC8xaEbAEkN6160ey4VKYVQumXzQ56Dq2WCl41r4keAbgwQuyap6-OiLmBclnWMSfmM8Y4-hHTysbE1gdkAuD3008D8PwLv7OC-yOXI6NFMu_KUJNb80xsRkdbwcA2GtOeEU6xpdWlcExLng64PhwmTFhn63Ycp5kumrPoJsI3_-558-3Tx_vrm_b27vOX6w-3redaqVZxIwch-cDhCowIQcuoXfTYmzioLkQzBK9RBR17raoD0MCHqD2aIPqrIM-bt6fdpeQfG9Jq55E8TpNLmDeyVUffgeZdV1FxQn3JRAWjXco4u3KwHOxRtz3ptlW3_avbqlqSpxJVOO2x2Me8lVRf-l_rD2BmhTo</recordid><startdate>20230701</startdate><enddate>20230701</enddate><creator>Muramatsu, Yasuji</creator><creator>Matsumoto, Yuya</creator><general>Springer Nature Singapore</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0001-6284-9825</orcidid></search><sort><creationdate>20230701</creationdate><title>Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films</title><author>Muramatsu, Yasuji ; Matsumoto, Yuya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1644-4183b231b105082dd63f6afce98fb47df8bdc6e4d6f9640030601bf6ce8d295d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><topic>Analytical Chemistry</topic><topic>Chemistry</topic><topic>Chemistry and Materials Science</topic><topic>Original Paper</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Muramatsu, Yasuji</creatorcontrib><creatorcontrib>Matsumoto, Yuya</creatorcontrib><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Analytical sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Muramatsu, Yasuji</au><au>Matsumoto, Yuya</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films</atitle><jtitle>Analytical sciences</jtitle><stitle>ANAL. SCI</stitle><date>2023-07-01</date><risdate>2023</risdate><volume>39</volume><issue>7</issue><spage>1089</spage><epage>1096</epage><pages>1089-1096</pages><issn>0910-6340</issn><eissn>1348-2246</eissn><abstract>To experimentally determine the mass absorption coefficient (
μ
) of a sp
3
-carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200–800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yield (TEY) modes. PE films were prepared by a spin-coating method. Their experimentally measured thickness and density are 200 nm and 0.920 g/cm
3
, respectively. Soft X-ray absorption measurements were performed in beamline BL-6.3.2 at the Advanced Light Source. Although surface oxygen can be slightly observed in the O K and C K regions in TEY-XAS, it cannot be observed in absorbance-XAS. The absorbance-XAS profiles agree well with the calculated profiles, except in the C K threshold. Hence, it can be confirmed that the absorption-XAS measurements are achieved. From the absorbance,
μ
of sp
3
-C in PE is 7 × 10
4
cm
2
/g near 288 eV and 294 eV.
Graphical abstract</abstract><cop>Singapore</cop><pub>Springer Nature Singapore</pub><doi>10.1007/s44211-023-00318-4</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0001-6284-9825</orcidid><oa>free_for_read</oa></addata></record> |
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| issn | 0910-6340 1348-2246 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_2829706177 |
| source | SpringerNature Journals; Open Access Titles of Japan; EZB-FREE-00999 freely available EZB journals |
| subjects | Analytical Chemistry Chemistry Chemistry and Materials Science Original Paper |
| title | Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films |
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