Nanoscale study on origins of the bright clusters in/on moisture-exposed tris(8-hydroxyquinoline) aluminum thin films

By exploiting variable-temperature tapping mode atomic force microscopy (VT-AFM), along with X-ray diffraction (XRD) and Fourier transform infrared spectroscopy, we have systematically investigated the nature of the bright clusters, which can be classified as protrusion and grown grain, in/on the mo...

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Veröffentlicht in:Synthetic metals 2004-09, Vol.145 (2), p.177-182
Hauptverfasser: Xu, M.S., Xu, J.B.
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description By exploiting variable-temperature tapping mode atomic force microscopy (VT-AFM), along with X-ray diffraction (XRD) and Fourier transform infrared spectroscopy, we have systematically investigated the nature of the bright clusters, which can be classified as protrusion and grown grain, in/on the moisture-exposed tris(8-hydroxyquinoline) aluminum (Alq 3) thin film. The experimental results suggest that the protrusion is most likely to be a hydrated Alq 3 species, whereas the grown grain is a crystalline Alq 3 structure. Moreover, the evolution of a hydrated Alq 3 species into a dark hole and/or a crystalline Alq 3 structure was in-situ visualized.
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subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Degradation
Electroluminescence
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Organic light-emitting diodes
Other luminescence and radiative recombination
Physics
Tris(8-hydroxyquinoline) aluminum
Variable temperature tapping mode atomic force microscopy
title Nanoscale study on origins of the bright clusters in/on moisture-exposed tris(8-hydroxyquinoline) aluminum thin films
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