Effect of a cover layer on the edge admittance of a wide microstrip
The canonical problem of a grounded dielectric slab with a truncated upper conductor and a dielectric cover layer is solved by the Wiener-Hopf technique. The method yields the value of the reflection coefficient at the open edge and the equivalent edge admittance. Numerical results show that the pre...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on antennas and propagation 1991-03, Vol.39 (3), p.354-358 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 358 |
---|---|
container_issue | 3 |
container_start_page | 354 |
container_title | IEEE transactions on antennas and propagation |
container_volume | 39 |
creator | Tu, Y. Chang, D.C. |
description | The canonical problem of a grounded dielectric slab with a truncated upper conductor and a dielectric cover layer is solved by the Wiener-Hopf technique. The method yields the value of the reflection coefficient at the open edge and the equivalent edge admittance. Numerical results show that the presence of a cover layer increases both the conductance and the susceptance. An increase in the value of edge conductance corresponds to an increase in the radiated power and surface-wave power. An increase in the value of the susceptance corresponds to an increase in the fringing capacitance at the edge. This results in a reduction of the physical length of a resonant rectangular patch. On the basis of Wiener-Hopf analysis it is seen that the space-wave power and the power carried by the surface wave are separated from the total radiated power. The numerical results show that the radiation efficiency decreases with an increase in the cover layer thickness.< > |
doi_str_mv | 10.1109/8.76334 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_28276704</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>76334</ieee_id><sourcerecordid>25186977</sourcerecordid><originalsourceid>FETCH-LOGICAL-c333t-30ed5611283ec859aa4726c2a67b68a0b453e3a6fdc10d31a6f4b42ffc7241843</originalsourceid><addsrcrecordid>eNqNkEtLAzEURoMoWKu4dpeNupqa1ySZpZT6gIIbBXdDmrnRyEynJqml_97UKbp1cx_cwwf3IHROyYRSUt3oiZKciwM0omWpC8YYPUQjQqguKiZfj9FJjB95FVqIEZrOnAObcO-wwbb_goBbs821X-L0DhiaN8Cm6XxKZmlh4Da-Adx5G_qYgl-doiNn2ghn-z5GL3ez5-lDMX-6f5zezgvLOU8FJ9CUklKmOVhdVsYIxaRlRqqF1IYsRMmBG-kaS0nDaZ7EQjDnrGKCasHH6GrIXYX-cw0x1Z2PFtrWLKFfx5pppqQi_wBLqmWlVAavB3D3Sgzg6lXwnQnbmpJ6Z7PW9Y_NTF7uI020pnUh2_DxD6-kYFl35i4GzgPA73nI-AZroXnz</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25186977</pqid></control><display><type>article</type><title>Effect of a cover layer on the edge admittance of a wide microstrip</title><source>IEEE Electronic Library (IEL)</source><creator>Tu, Y. ; Chang, D.C.</creator><creatorcontrib>Tu, Y. ; Chang, D.C.</creatorcontrib><description>The canonical problem of a grounded dielectric slab with a truncated upper conductor and a dielectric cover layer is solved by the Wiener-Hopf technique. The method yields the value of the reflection coefficient at the open edge and the equivalent edge admittance. Numerical results show that the presence of a cover layer increases both the conductance and the susceptance. An increase in the value of edge conductance corresponds to an increase in the radiated power and surface-wave power. An increase in the value of the susceptance corresponds to an increase in the fringing capacitance at the edge. This results in a reduction of the physical length of a resonant rectangular patch. On the basis of Wiener-Hopf analysis it is seen that the space-wave power and the power carried by the surface wave are separated from the total radiated power. The numerical results show that the radiation efficiency decreases with an increase in the cover layer thickness.< ></description><identifier>ISSN: 0018-926X</identifier><identifier>EISSN: 1558-2221</identifier><identifier>DOI: 10.1109/8.76334</identifier><identifier>CODEN: IETPAK</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Admittance ; Antennas ; Applied sciences ; Dielectric constant ; Dielectric losses ; Electromagnetic fields ; Electromagnetic scattering ; Exact sciences and technology ; Microstrip antennas ; Optical scattering ; Optical surface waves ; Patch antennas ; Radiocommunications ; Surface waves ; Telecommunications ; Telecommunications and information theory</subject><ispartof>IEEE transactions on antennas and propagation, 1991-03, Vol.39 (3), p.354-358</ispartof><rights>1991 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c333t-30ed5611283ec859aa4726c2a67b68a0b453e3a6fdc10d31a6f4b42ffc7241843</citedby><cites>FETCH-LOGICAL-c333t-30ed5611283ec859aa4726c2a67b68a0b453e3a6fdc10d31a6f4b42ffc7241843</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/76334$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/76334$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19642558$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Tu, Y.</creatorcontrib><creatorcontrib>Chang, D.C.</creatorcontrib><title>Effect of a cover layer on the edge admittance of a wide microstrip</title><title>IEEE transactions on antennas and propagation</title><addtitle>TAP</addtitle><description>The canonical problem of a grounded dielectric slab with a truncated upper conductor and a dielectric cover layer is solved by the Wiener-Hopf technique. The method yields the value of the reflection coefficient at the open edge and the equivalent edge admittance. Numerical results show that the presence of a cover layer increases both the conductance and the susceptance. An increase in the value of edge conductance corresponds to an increase in the radiated power and surface-wave power. An increase in the value of the susceptance corresponds to an increase in the fringing capacitance at the edge. This results in a reduction of the physical length of a resonant rectangular patch. On the basis of Wiener-Hopf analysis it is seen that the space-wave power and the power carried by the surface wave are separated from the total radiated power. The numerical results show that the radiation efficiency decreases with an increase in the cover layer thickness.< ></description><subject>Admittance</subject><subject>Antennas</subject><subject>Applied sciences</subject><subject>Dielectric constant</subject><subject>Dielectric losses</subject><subject>Electromagnetic fields</subject><subject>Electromagnetic scattering</subject><subject>Exact sciences and technology</subject><subject>Microstrip antennas</subject><subject>Optical scattering</subject><subject>Optical surface waves</subject><subject>Patch antennas</subject><subject>Radiocommunications</subject><subject>Surface waves</subject><subject>Telecommunications</subject><subject>Telecommunications and information theory</subject><issn>0018-926X</issn><issn>1558-2221</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1991</creationdate><recordtype>article</recordtype><recordid>eNqNkEtLAzEURoMoWKu4dpeNupqa1ySZpZT6gIIbBXdDmrnRyEynJqml_97UKbp1cx_cwwf3IHROyYRSUt3oiZKciwM0omWpC8YYPUQjQqguKiZfj9FJjB95FVqIEZrOnAObcO-wwbb_goBbs821X-L0DhiaN8Cm6XxKZmlh4Da-Adx5G_qYgl-doiNn2ghn-z5GL3ez5-lDMX-6f5zezgvLOU8FJ9CUklKmOVhdVsYIxaRlRqqF1IYsRMmBG-kaS0nDaZ7EQjDnrGKCasHH6GrIXYX-cw0x1Z2PFtrWLKFfx5pppqQi_wBLqmWlVAavB3D3Sgzg6lXwnQnbmpJ6Z7PW9Y_NTF7uI020pnUh2_DxD6-kYFl35i4GzgPA73nI-AZroXnz</recordid><startdate>19910301</startdate><enddate>19910301</enddate><creator>Tu, Y.</creator><creator>Chang, D.C.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope></search><sort><creationdate>19910301</creationdate><title>Effect of a cover layer on the edge admittance of a wide microstrip</title><author>Tu, Y. ; Chang, D.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c333t-30ed5611283ec859aa4726c2a67b68a0b453e3a6fdc10d31a6f4b42ffc7241843</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Admittance</topic><topic>Antennas</topic><topic>Applied sciences</topic><topic>Dielectric constant</topic><topic>Dielectric losses</topic><topic>Electromagnetic fields</topic><topic>Electromagnetic scattering</topic><topic>Exact sciences and technology</topic><topic>Microstrip antennas</topic><topic>Optical scattering</topic><topic>Optical surface waves</topic><topic>Patch antennas</topic><topic>Radiocommunications</topic><topic>Surface waves</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tu, Y.</creatorcontrib><creatorcontrib>Chang, D.C.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics & Communications Abstracts</collection><jtitle>IEEE transactions on antennas and propagation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tu, Y.</au><au>Chang, D.C.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of a cover layer on the edge admittance of a wide microstrip</atitle><jtitle>IEEE transactions on antennas and propagation</jtitle><stitle>TAP</stitle><date>1991-03-01</date><risdate>1991</risdate><volume>39</volume><issue>3</issue><spage>354</spage><epage>358</epage><pages>354-358</pages><issn>0018-926X</issn><eissn>1558-2221</eissn><coden>IETPAK</coden><abstract>The canonical problem of a grounded dielectric slab with a truncated upper conductor and a dielectric cover layer is solved by the Wiener-Hopf technique. The method yields the value of the reflection coefficient at the open edge and the equivalent edge admittance. Numerical results show that the presence of a cover layer increases both the conductance and the susceptance. An increase in the value of edge conductance corresponds to an increase in the radiated power and surface-wave power. An increase in the value of the susceptance corresponds to an increase in the fringing capacitance at the edge. This results in a reduction of the physical length of a resonant rectangular patch. On the basis of Wiener-Hopf analysis it is seen that the space-wave power and the power carried by the surface wave are separated from the total radiated power. The numerical results show that the radiation efficiency decreases with an increase in the cover layer thickness.< ></abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/8.76334</doi><tpages>5</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-926X |
ispartof | IEEE transactions on antennas and propagation, 1991-03, Vol.39 (3), p.354-358 |
issn | 0018-926X 1558-2221 |
language | eng |
recordid | cdi_proquest_miscellaneous_28276704 |
source | IEEE Electronic Library (IEL) |
subjects | Admittance Antennas Applied sciences Dielectric constant Dielectric losses Electromagnetic fields Electromagnetic scattering Exact sciences and technology Microstrip antennas Optical scattering Optical surface waves Patch antennas Radiocommunications Surface waves Telecommunications Telecommunications and information theory |
title | Effect of a cover layer on the edge admittance of a wide microstrip |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T10%3A59%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effect%20of%20a%20cover%20layer%20on%20the%20edge%20admittance%20of%20a%20wide%20microstrip&rft.jtitle=IEEE%20transactions%20on%20antennas%20and%20propagation&rft.au=Tu,%20Y.&rft.date=1991-03-01&rft.volume=39&rft.issue=3&rft.spage=354&rft.epage=358&rft.pages=354-358&rft.issn=0018-926X&rft.eissn=1558-2221&rft.coden=IETPAK&rft_id=info:doi/10.1109/8.76334&rft_dat=%3Cproquest_RIE%3E25186977%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25186977&rft_id=info:pmid/&rft_ieee_id=76334&rfr_iscdi=true |