Morphology and electrical transport in pentacene films on silylated oxide surfaces
A study comparing the morphology and electrical transport properties of pentacene films on underlayers of different self-assembled monolayers (SAMs) is presented. The SAMs studied as underlayers were phenyltrichlorosilane, n-octadecyltrichlorosilane, and t-butyldiphenylchlorosilane. Pentacene thin f...
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| Veröffentlicht in: | Journal of materials research 2004-07, Vol.19 (7), p.2003-2007 |
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| container_title | Journal of materials research |
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| creator | Shankar, Karthik Jackson, Thomas N. |
| description | A study comparing the morphology and electrical transport properties of pentacene films on underlayers of different self-assembled monolayers (SAMs) is presented. The SAMs studied as underlayers were phenyltrichlorosilane, n-octadecyltrichlorosilane, and t-butyldiphenylchlorosilane. Pentacene thin films were grown by vacuum sublimation on SiO2 surfaces treated with self-assembled monolayers. During deposition, substrates were held at a temperature of 70 °C. The morphologies of the films at different stages of deposition were studied by atomic force microscopy, and the transport properties of the films were characterized by I-V measurements in a simple field-effect transistor (FET) structure. The SAM underlayers strongly influence the film morphology in the first few molecular layers and hence significantly impact the electrical transport in the resulting FETs. |
| doi_str_mv | 10.1557/JMR.2004.0255 |
| format | Article |
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| subjects | Articles—Organic Electronics Special Section Organic Scanning probe microscopy (SPM) Semiconductor |
| title | Morphology and electrical transport in pentacene films on silylated oxide surfaces |
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