A defect-tolerant memory architecture for molecular electronics

This paper presents a defect-tolerant memory architecture for molecular electronics. A crossbar structure, where molecules are sandwiched between nanowires, is used as a model to realize molecular memory and to achieve defect tolerance. Defects in the logic circuits for addressing memory are also ta...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on nanotechnology 2004-03, Vol.3 (1), p.152-157
Hauptverfasser: Lee, M.-H., Kim, Y.K., Choi, Y.-H.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This paper presents a defect-tolerant memory architecture for molecular electronics. A crossbar structure, where molecules are sandwiched between nanowires, is used as a model to realize molecular memory and to achieve defect tolerance. Defects in the logic circuits for addressing memory are also taken into account. The number of spare rows and columns to form a functioning memory is estimated by computer simulation for various values of defect rate and memory size.
ISSN:1536-125X
1941-0085
DOI:10.1109/TNANO.2004.824011