Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions

A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-II field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relation...

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Veröffentlicht in:	IEEE transactions on nuclear science 2004-10, Vol.51 (5), p.2825-2833
Hauptverfasser:	Koga, R., George, J., Swift, G., Yui, C., Edmonds, L., Carmichael, C., Langley, T., Murray, P., Lanes, K., Napier, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Field programmable gate arrays Ion radiation effects Ionization Laboratories Proton radiation effects Scattering Semiconductor device testing Single event upset SRAM chips
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