Growth of gadolinium oxide thin films by liquid injection MOCVD using a new gadolinium alkoxide precursor
The use of materials with a higher dielectric constant than SiO2 allows an equivalent capacitance to be achieved in an insulating layer, which should provide reduced leakage currents. Thin films of gadolinium oxide, GdOx, have been deposited by liquid injection MOCVD using the volatile gadolinium al...
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Veröffentlicht in: | Chemical vapor deposition 2004-12, Vol.10 (6), p.301-305 |
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container_title | Chemical vapor deposition |
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creator | ASPINALL, Helen C GASKELL, Jeffrey M YIM FUN LOO JONES, Anthony C CHALKER, Paul R POTTER, Richard J SMITH, Lesley M CRITCHLOW, Gary W |
description | The use of materials with a higher dielectric constant than SiO2 allows an equivalent capacitance to be achieved in an insulating layer, which should provide reduced leakage currents. Thin films of gadolinium oxide, GdOx, have been deposited by liquid injection MOCVD using the volatile gadolinium alkoxide precursor, [Gd(mmp)3] (mmp=1-methoxy-2-methyl-2-propanolate, OCMe2CH2OMe). Carbon-free GdO, films were grown over a wide range of substrate temperatures (300-600 DGC) on both Si(100) and GaAs(100) substrates. X-ray diffraction (XRD) data indicated that GdO.r films grown on Si(100) were amorphous at low deposition temperatures, and crystalline with a C-type structure at growth temperatures of 450'C and above. GdOY films grown on GaAs at 450 deg C showed a strong preferred orientation, dominated by the (222) reflection. |
doi_str_mv | 10.1002/cvde.200306310 |
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fullrecord | <record><control><sourceid>proquest_pasca</sourceid><recordid>TN_cdi_proquest_miscellaneous_28190232</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>28190232</sourcerecordid><originalsourceid>FETCH-LOGICAL-p216t-cdb8165e9a0f5902f12ddc07d3ff546802efc8aa860bc4d1f5dcf94f6e5742573</originalsourceid><addsrcrecordid>eNpN0DtPwzAYhWELgUQprMxeYEv5bMdOMqICBamoC7BGri-ti2OncULpv6dSOzCd5dUzHIRuCUwIAH1QP9pMKAADwQicoRHhlGSsFPQcjaDKy4xUUFyiq5Q2AFAJRkfIzbq469c4WrySOnoX3NDg-Ou0wf3aBWydbxJe7rF328Fp7MLGqN7FgN8X068nPCQXVljiYHb_Bem_j0jbGTV0KXbX6MJKn8zNacfo8-X5Y_qazRezt-njPGspEX2m9LIkgptKguUVUEuo1goKzazluSiBGqtKKUsBS5VrYrlWtsqtMLzIKS_YGN0f3baL28Gkvm5cUsZ7GUwcUk3Lww2U0UN4dwplUtLbTgblUt12rpHdviaCVTnhjP0BTmNpeQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>28190232</pqid></control><display><type>article</type><title>Growth of gadolinium oxide thin films by liquid injection MOCVD using a new gadolinium alkoxide precursor</title><source>Access via Wiley Online Library</source><creator>ASPINALL, Helen C ; GASKELL, Jeffrey M ; YIM FUN LOO ; JONES, Anthony C ; CHALKER, Paul R ; POTTER, Richard J ; SMITH, Lesley M ; CRITCHLOW, Gary W</creator><creatorcontrib>ASPINALL, Helen C ; GASKELL, Jeffrey M ; YIM FUN LOO ; JONES, Anthony C ; CHALKER, Paul R ; POTTER, Richard J ; SMITH, Lesley M ; CRITCHLOW, Gary W</creatorcontrib><description>The use of materials with a higher dielectric constant than SiO2 allows an equivalent capacitance to be achieved in an insulating layer, which should provide reduced leakage currents. Thin films of gadolinium oxide, GdOx, have been deposited by liquid injection MOCVD using the volatile gadolinium alkoxide precursor, [Gd(mmp)3] (mmp=1-methoxy-2-methyl-2-propanolate, OCMe2CH2OMe). Carbon-free GdO, films were grown over a wide range of substrate temperatures (300-600 DGC) on both Si(100) and GaAs(100) substrates. X-ray diffraction (XRD) data indicated that GdO.r films grown on Si(100) were amorphous at low deposition temperatures, and crystalline with a C-type structure at growth temperatures of 450'C and above. GdOY films grown on GaAs at 450 deg C showed a strong preferred orientation, dominated by the (222) reflection.</description><identifier>ISSN: 0948-1907</identifier><identifier>EISSN: 1521-3862</identifier><identifier>DOI: 10.1002/cvde.200306310</identifier><language>eng</language><publisher>Weinheim: Wiley-VCH</publisher><subject>Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Physics</subject><ispartof>Chemical vapor deposition, 2004-12, Vol.10 (6), p.301-305</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16394153$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>ASPINALL, Helen C</creatorcontrib><creatorcontrib>GASKELL, Jeffrey M</creatorcontrib><creatorcontrib>YIM FUN LOO</creatorcontrib><creatorcontrib>JONES, Anthony C</creatorcontrib><creatorcontrib>CHALKER, Paul R</creatorcontrib><creatorcontrib>POTTER, Richard J</creatorcontrib><creatorcontrib>SMITH, Lesley M</creatorcontrib><creatorcontrib>CRITCHLOW, Gary W</creatorcontrib><title>Growth of gadolinium oxide thin films by liquid injection MOCVD using a new gadolinium alkoxide precursor</title><title>Chemical vapor deposition</title><description>The use of materials with a higher dielectric constant than SiO2 allows an equivalent capacitance to be achieved in an insulating layer, which should provide reduced leakage currents. Thin films of gadolinium oxide, GdOx, have been deposited by liquid injection MOCVD using the volatile gadolinium alkoxide precursor, [Gd(mmp)3] (mmp=1-methoxy-2-methyl-2-propanolate, OCMe2CH2OMe). Carbon-free GdO, films were grown over a wide range of substrate temperatures (300-600 DGC) on both Si(100) and GaAs(100) substrates. X-ray diffraction (XRD) data indicated that GdO.r films grown on Si(100) were amorphous at low deposition temperatures, and crystalline with a C-type structure at growth temperatures of 450'C and above. GdOY films grown on GaAs at 450 deg C showed a strong preferred orientation, dominated by the (222) reflection.</description><subject>Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.)</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Methods of deposition of films and coatings; film growth and epitaxy</subject><subject>Physics</subject><issn>0948-1907</issn><issn>1521-3862</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNpN0DtPwzAYhWELgUQprMxeYEv5bMdOMqICBamoC7BGri-ti2OncULpv6dSOzCd5dUzHIRuCUwIAH1QP9pMKAADwQicoRHhlGSsFPQcjaDKy4xUUFyiq5Q2AFAJRkfIzbq469c4WrySOnoX3NDg-Ou0wf3aBWydbxJe7rF328Fp7MLGqN7FgN8X068nPCQXVljiYHb_Bem_j0jbGTV0KXbX6MJKn8zNacfo8-X5Y_qazRezt-njPGspEX2m9LIkgptKguUVUEuo1goKzazluSiBGqtKKUsBS5VrYrlWtsqtMLzIKS_YGN0f3baL28Gkvm5cUsZ7GUwcUk3Lww2U0UN4dwplUtLbTgblUt12rpHdviaCVTnhjP0BTmNpeQ</recordid><startdate>20041201</startdate><enddate>20041201</enddate><creator>ASPINALL, Helen C</creator><creator>GASKELL, Jeffrey M</creator><creator>YIM FUN LOO</creator><creator>JONES, Anthony C</creator><creator>CHALKER, Paul R</creator><creator>POTTER, Richard J</creator><creator>SMITH, Lesley M</creator><creator>CRITCHLOW, Gary W</creator><general>Wiley-VCH</general><scope>IQODW</scope><scope>7QQ</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20041201</creationdate><title>Growth of gadolinium oxide thin films by liquid injection MOCVD using a new gadolinium alkoxide precursor</title><author>ASPINALL, Helen C ; GASKELL, Jeffrey M ; YIM FUN LOO ; JONES, Anthony C ; CHALKER, Paul R ; POTTER, Richard J ; SMITH, Lesley M ; CRITCHLOW, Gary W</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p216t-cdb8165e9a0f5902f12ddc07d3ff546802efc8aa860bc4d1f5dcf94f6e5742573</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.)</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Methods of deposition of films and coatings; film growth and epitaxy</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>ASPINALL, Helen C</creatorcontrib><creatorcontrib>GASKELL, Jeffrey M</creatorcontrib><creatorcontrib>YIM FUN LOO</creatorcontrib><creatorcontrib>JONES, Anthony C</creatorcontrib><creatorcontrib>CHALKER, Paul R</creatorcontrib><creatorcontrib>POTTER, Richard J</creatorcontrib><creatorcontrib>SMITH, Lesley M</creatorcontrib><creatorcontrib>CRITCHLOW, Gary W</creatorcontrib><collection>Pascal-Francis</collection><collection>Ceramic Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Chemical vapor deposition</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ASPINALL, Helen C</au><au>GASKELL, Jeffrey M</au><au>YIM FUN LOO</au><au>JONES, Anthony C</au><au>CHALKER, Paul R</au><au>POTTER, Richard J</au><au>SMITH, Lesley M</au><au>CRITCHLOW, Gary W</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth of gadolinium oxide thin films by liquid injection MOCVD using a new gadolinium alkoxide precursor</atitle><jtitle>Chemical vapor deposition</jtitle><date>2004-12-01</date><risdate>2004</risdate><volume>10</volume><issue>6</issue><spage>301</spage><epage>305</epage><pages>301-305</pages><issn>0948-1907</issn><eissn>1521-3862</eissn><abstract>The use of materials with a higher dielectric constant than SiO2 allows an equivalent capacitance to be achieved in an insulating layer, which should provide reduced leakage currents. Thin films of gadolinium oxide, GdOx, have been deposited by liquid injection MOCVD using the volatile gadolinium alkoxide precursor, [Gd(mmp)3] (mmp=1-methoxy-2-methyl-2-propanolate, OCMe2CH2OMe). Carbon-free GdO, films were grown over a wide range of substrate temperatures (300-600 DGC) on both Si(100) and GaAs(100) substrates. X-ray diffraction (XRD) data indicated that GdO.r films grown on Si(100) were amorphous at low deposition temperatures, and crystalline with a C-type structure at growth temperatures of 450'C and above. GdOY films grown on GaAs at 450 deg C showed a strong preferred orientation, dominated by the (222) reflection.</abstract><cop>Weinheim</cop><pub>Wiley-VCH</pub><doi>10.1002/cvde.200306310</doi><tpages>5</tpages></addata></record> |
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subjects | Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.) Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of deposition of films and coatings film growth and epitaxy Physics |
title | Growth of gadolinium oxide thin films by liquid injection MOCVD using a new gadolinium alkoxide precursor |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T13%3A12%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pasca&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Growth%20of%20gadolinium%20oxide%20thin%20films%20by%20liquid%20injection%20MOCVD%20using%20a%20new%20gadolinium%20alkoxide%20precursor&rft.jtitle=Chemical%20vapor%20deposition&rft.au=ASPINALL,%20Helen%20C&rft.date=2004-12-01&rft.volume=10&rft.issue=6&rft.spage=301&rft.epage=305&rft.pages=301-305&rft.issn=0948-1907&rft.eissn=1521-3862&rft_id=info:doi/10.1002/cvde.200306310&rft_dat=%3Cproquest_pasca%3E28190232%3C/proquest_pasca%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=28190232&rft_id=info:pmid/&rfr_iscdi=true |