Optical phased array with on-chip phase calibration
Optical phased arrays (OPAs) with phase-monitoring and phase-control capabilities are necessary for robust and accurate beamforming applications. This paper demonstrates an on-chip integrated phase calibration system where compact phase interrogator structures and readout photodiodes are implemented...
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Veröffentlicht in: | Optics letters 2022-12, Vol.47 (23), p.6081-6084 |
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creator | Prost, Mathias Kjellman, Jon Øyvind Dwivedi, Sarvagya Marinins, Aleksandrs Tyagi, Hemant Kumar Kongnyuy, Tangla David Soussan, Philippe Dahlem, Marcus S Rottenberg, Xavier Jansen, Roelof |
description | Optical phased arrays (OPAs) with phase-monitoring and phase-control capabilities are necessary for robust and accurate beamforming applications. This paper demonstrates an on-chip integrated phase calibration system where compact phase interrogator structures and readout photodiodes are implemented within the OPA architecture. This enables phase-error correction for high-fidelity beam-steering with linear complexity calibration. A 32-channel OPA with 2.5-µm pitch is fabricated in an Si-SiN photonic stack. The readout is done with silicon photon-assisted tunneling detectors (PATDs) for sub-bandgap light detection with no-process change. After the model-based calibration procedure, the beam emitted by the OPA exhibits a sidelobe suppression ratio (SLSR) of -11 dB and a beam divergence of 0.97° × 0.58° at 1.55-µm input wavelength. Wavelength-dependent calibration and tuning are also performed, allowing full 2D beam steering and arbitrary pattern generation with a low complexity algorithm. |
doi_str_mv | 10.1364/OL.467779 |
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This paper demonstrates an on-chip integrated phase calibration system where compact phase interrogator structures and readout photodiodes are implemented within the OPA architecture. This enables phase-error correction for high-fidelity beam-steering with linear complexity calibration. A 32-channel OPA with 2.5-µm pitch is fabricated in an Si-SiN photonic stack. The readout is done with silicon photon-assisted tunneling detectors (PATDs) for sub-bandgap light detection with no-process change. After the model-based calibration procedure, the beam emitted by the OPA exhibits a sidelobe suppression ratio (SLSR) of -11 dB and a beam divergence of 0.97° × 0.58° at 1.55-µm input wavelength. 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This paper demonstrates an on-chip integrated phase calibration system where compact phase interrogator structures and readout photodiodes are implemented within the OPA architecture. This enables phase-error correction for high-fidelity beam-steering with linear complexity calibration. A 32-channel OPA with 2.5-µm pitch is fabricated in an Si-SiN photonic stack. The readout is done with silicon photon-assisted tunneling detectors (PATDs) for sub-bandgap light detection with no-process change. After the model-based calibration procedure, the beam emitted by the OPA exhibits a sidelobe suppression ratio (SLSR) of -11 dB and a beam divergence of 0.97° × 0.58° at 1.55-µm input wavelength. Wavelength-dependent calibration and tuning are also performed, allowing full 2D beam steering and arbitrary pattern generation with a low complexity algorithm.</description><subject>Algorithms</subject><subject>Beam steering</subject><subject>Beamforming</subject><subject>Calibration</subject><subject>Complexity</subject><subject>Energy gap</subject><subject>Error correction</subject><subject>Pattern generation</subject><subject>Phased arrays</subject><subject>Photodiodes</subject><subject>Sidelobe reduction</subject><subject>Sidelobes</subject><subject>Silicon</subject><issn>0146-9592</issn><issn>1539-4794</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><recordid>eNpd0D1PwzAQBmALgWgpDPwBFIkFhpRzzvHFI6r4kiJlgdlyHUdNlSbBToX67wlKYWC64Z57dXoZu-aw5CjFQ5EvhSQidcLmPEUVC1LilM2BCxmrVCUzdhHCFgAkIZ6zGVLCFSeaMyz6obamifqNCa6MjPfmEH3Vwybq2thu6n7aRKOp194MdddesrPKNMFdHeeCfTw_va9e47x4eVs95rFFjkNMAK6UmSiNWadEJiWLiZUuBQRpBYBRWFVZhTyDikNGQBwSqpQRmUMOuGB3U27vu8-9C4Pe1cG6pjGt6_ZBJ9l4KSFVNNLbf3Tb7X07fqcTElKo0cpR3U_K-i4E7yrd-3pn_EFz0D9N6iLXU5OjvTkm7tc7V_7J3-rwG2C_apY</recordid><startdate>20221201</startdate><enddate>20221201</enddate><creator>Prost, Mathias</creator><creator>Kjellman, Jon Øyvind</creator><creator>Dwivedi, Sarvagya</creator><creator>Marinins, Aleksandrs</creator><creator>Tyagi, Hemant Kumar</creator><creator>Kongnyuy, Tangla David</creator><creator>Soussan, Philippe</creator><creator>Dahlem, Marcus S</creator><creator>Rottenberg, Xavier</creator><creator>Jansen, Roelof</creator><general>Optical Society of America</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7X8</scope><orcidid>https://orcid.org/0000-0003-1184-3225</orcidid><orcidid>https://orcid.org/0000-0001-5273-4426</orcidid></search><sort><creationdate>20221201</creationdate><title>Optical phased array with on-chip phase calibration</title><author>Prost, Mathias ; Kjellman, Jon Øyvind ; Dwivedi, Sarvagya ; Marinins, Aleksandrs ; Tyagi, Hemant Kumar ; Kongnyuy, Tangla David ; Soussan, Philippe ; Dahlem, Marcus S ; Rottenberg, Xavier ; Jansen, Roelof</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c313t-700ed684daab577a57c32c6e50306c400a93ff8f3180f1087071027f9a48e3103</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Algorithms</topic><topic>Beam steering</topic><topic>Beamforming</topic><topic>Calibration</topic><topic>Complexity</topic><topic>Energy gap</topic><topic>Error correction</topic><topic>Pattern generation</topic><topic>Phased arrays</topic><topic>Photodiodes</topic><topic>Sidelobe reduction</topic><topic>Sidelobes</topic><topic>Silicon</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Prost, Mathias</creatorcontrib><creatorcontrib>Kjellman, Jon Øyvind</creatorcontrib><creatorcontrib>Dwivedi, Sarvagya</creatorcontrib><creatorcontrib>Marinins, Aleksandrs</creatorcontrib><creatorcontrib>Tyagi, Hemant Kumar</creatorcontrib><creatorcontrib>Kongnyuy, Tangla David</creatorcontrib><creatorcontrib>Soussan, Philippe</creatorcontrib><creatorcontrib>Dahlem, Marcus S</creatorcontrib><creatorcontrib>Rottenberg, Xavier</creatorcontrib><creatorcontrib>Jansen, Roelof</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><jtitle>Optics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Prost, Mathias</au><au>Kjellman, Jon Øyvind</au><au>Dwivedi, Sarvagya</au><au>Marinins, Aleksandrs</au><au>Tyagi, Hemant Kumar</au><au>Kongnyuy, Tangla David</au><au>Soussan, Philippe</au><au>Dahlem, Marcus S</au><au>Rottenberg, Xavier</au><au>Jansen, Roelof</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Optical phased array with on-chip phase calibration</atitle><jtitle>Optics letters</jtitle><addtitle>Opt Lett</addtitle><date>2022-12-01</date><risdate>2022</risdate><volume>47</volume><issue>23</issue><spage>6081</spage><epage>6084</epage><pages>6081-6084</pages><issn>0146-9592</issn><eissn>1539-4794</eissn><abstract>Optical phased arrays (OPAs) with phase-monitoring and phase-control capabilities are necessary for robust and accurate beamforming applications. This paper demonstrates an on-chip integrated phase calibration system where compact phase interrogator structures and readout photodiodes are implemented within the OPA architecture. This enables phase-error correction for high-fidelity beam-steering with linear complexity calibration. A 32-channel OPA with 2.5-µm pitch is fabricated in an Si-SiN photonic stack. The readout is done with silicon photon-assisted tunneling detectors (PATDs) for sub-bandgap light detection with no-process change. After the model-based calibration procedure, the beam emitted by the OPA exhibits a sidelobe suppression ratio (SLSR) of -11 dB and a beam divergence of 0.97° × 0.58° at 1.55-µm input wavelength. Wavelength-dependent calibration and tuning are also performed, allowing full 2D beam steering and arbitrary pattern generation with a low complexity algorithm.</abstract><cop>United States</cop><pub>Optical Society of America</pub><pmid>37219177</pmid><doi>10.1364/OL.467779</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0003-1184-3225</orcidid><orcidid>https://orcid.org/0000-0001-5273-4426</orcidid></addata></record> |
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source | Optica Publishing Group Journals |
subjects | Algorithms Beam steering Beamforming Calibration Complexity Energy gap Error correction Pattern generation Phased arrays Photodiodes Sidelobe reduction Sidelobes Silicon |
title | Optical phased array with on-chip phase calibration |
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