Diagnosis of repeated failures for discrete event systems with linear-time temporal-logic specifications
In our earlier work, we introduced a state-based approach for the diagnosis of repeatedly occurring failures in discrete event systems (DESs). Since temporal logic provides a simpler way of specifying system properties; in this paper, a temporal-logic-based approach for diagnosing the occurrence of...
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Veröffentlicht in: | IEEE transactions on automation science and engineering 2006-01, Vol.3 (1), p.47-59 |
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description | In our earlier work, we introduced a state-based approach for the diagnosis of repeatedly occurring failures in discrete event systems (DESs). Since temporal logic provides a simpler way of specifying system properties; in this paper, a temporal-logic-based approach for diagnosing the occurrence of a repeated number of failures is developed. Linear-time temporal-logic (LTL) formulae are used to represent the specifications of DESs. Notions of prediagnosability for failures and diagnosability for repeated failures are introduced in the setting of temporal logic. A polynomial algorithm for the test of prediagnosability for failures is provided. The diagnosis problem for repeated failures in the temporal-logic setting is reduced to one in a state-based setting, and so the prior results of a state-based repeated failure diagnosis can be applied. Finally, a simple example is given for illustration. Note to Practitioners-Certain failures in a system are repeatable, such as routing errors in a manufacturing system. A theory for the diagnosis of such failures was presented in an earlier work of Jiang et al. The present paper uses temporal logic to specify such failures. It turns out that repeatable failures can be specified as violations of invariant properties (i.e., properties that must always hold). Given an invariant property that the system must always satisfy, an algorithm is presented to refine the system model and label those states of the refined system where the property is violated. The problem of repeated diagnosis then requires determining, within a bounded delay, each time a "failure-state" is visited. For this analysis, the existing theory developed by Jiang et al. is used. |
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Since temporal logic provides a simpler way of specifying system properties; in this paper, a temporal-logic-based approach for diagnosing the occurrence of a repeated number of failures is developed. Linear-time temporal-logic (LTL) formulae are used to represent the specifications of DESs. Notions of prediagnosability for failures and diagnosability for repeated failures are introduced in the setting of temporal logic. A polynomial algorithm for the test of prediagnosability for failures is provided. The diagnosis problem for repeated failures in the temporal-logic setting is reduced to one in a state-based setting, and so the prior results of a state-based repeated failure diagnosis can be applied. Finally, a simple example is given for illustration. Note to Practitioners-Certain failures in a system are repeatable, such as routing errors in a manufacturing system. A theory for the diagnosis of such failures was presented in an earlier work of Jiang et al. The present paper uses temporal logic to specify such failures. It turns out that repeatable failures can be specified as violations of invariant properties (i.e., properties that must always hold). Given an invariant property that the system must always satisfy, an algorithm is presented to refine the system model and label those states of the refined system where the property is violated. The problem of repeated diagnosis then requires determining, within a bounded delay, each time a "failure-state" is visited. For this analysis, the existing theory developed by Jiang et al. is used.</description><identifier>ISSN: 1545-5955</identifier><identifier>EISSN: 1558-3783</identifier><identifier>DOI: 10.1109/TASE.2005.860613</identifier><identifier>CODEN: ITASC7</identifier><language>eng</language><publisher>Piscataway, NJ: IEEE</publisher><subject>Algorithms ; Applied sciences ; Combinatorics ; Computer science; control theory; systems ; Control theory. Systems ; Delay ; Delay effects ; Diagnosis ; Diagnostics ; Discrete event system ; Discrete event systems ; Event detection ; Event driven simulation ; Exact sciences and technology ; Failure ; Failure analysis ; Formal specifications ; Invariants ; linear-time temporal logic (LTL) ; Logic ; Logic programming ; Manufacturing systems ; Operational research and scientific management ; Operational research. Management science ; Polynomials ; Reliability theory. Replacement problems ; repeated failure diagnosis ; Research and development ; Routing ; Specifications ; System testing ; Temporal logic</subject><ispartof>IEEE transactions on automation science and engineering, 2006-01, Vol.3 (1), p.47-59</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jan 2006</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c414t-65c0dc3ffd0342e19c7ea8fa4c87cec81e3a11df49443e1db297878b4b1a0f863</citedby><cites>FETCH-LOGICAL-c414t-65c0dc3ffd0342e19c7ea8fa4c87cec81e3a11df49443e1db297878b4b1a0f863</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1566657$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,4024,27923,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1566657$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17390321$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Shengbing Jiang</creatorcontrib><creatorcontrib>Kumar, R.</creatorcontrib><title>Diagnosis of repeated failures for discrete event systems with linear-time temporal-logic specifications</title><title>IEEE transactions on automation science and engineering</title><addtitle>TASE</addtitle><description>In our earlier work, we introduced a state-based approach for the diagnosis of repeatedly occurring failures in discrete event systems (DESs). Since temporal logic provides a simpler way of specifying system properties; in this paper, a temporal-logic-based approach for diagnosing the occurrence of a repeated number of failures is developed. Linear-time temporal-logic (LTL) formulae are used to represent the specifications of DESs. Notions of prediagnosability for failures and diagnosability for repeated failures are introduced in the setting of temporal logic. A polynomial algorithm for the test of prediagnosability for failures is provided. The diagnosis problem for repeated failures in the temporal-logic setting is reduced to one in a state-based setting, and so the prior results of a state-based repeated failure diagnosis can be applied. Finally, a simple example is given for illustration. Note to Practitioners-Certain failures in a system are repeatable, such as routing errors in a manufacturing system. A theory for the diagnosis of such failures was presented in an earlier work of Jiang et al. The present paper uses temporal logic to specify such failures. It turns out that repeatable failures can be specified as violations of invariant properties (i.e., properties that must always hold). Given an invariant property that the system must always satisfy, an algorithm is presented to refine the system model and label those states of the refined system where the property is violated. The problem of repeated diagnosis then requires determining, within a bounded delay, each time a "failure-state" is visited. For this analysis, the existing theory developed by Jiang et al. is used.</description><subject>Algorithms</subject><subject>Applied sciences</subject><subject>Combinatorics</subject><subject>Computer science; control theory; systems</subject><subject>Control theory. Systems</subject><subject>Delay</subject><subject>Delay effects</subject><subject>Diagnosis</subject><subject>Diagnostics</subject><subject>Discrete event system</subject><subject>Discrete event systems</subject><subject>Event detection</subject><subject>Event driven simulation</subject><subject>Exact sciences and technology</subject><subject>Failure</subject><subject>Failure analysis</subject><subject>Formal specifications</subject><subject>Invariants</subject><subject>linear-time temporal logic (LTL)</subject><subject>Logic</subject><subject>Logic programming</subject><subject>Manufacturing systems</subject><subject>Operational research and scientific management</subject><subject>Operational research. Management science</subject><subject>Polynomials</subject><subject>Reliability theory. Replacement problems</subject><subject>repeated failure diagnosis</subject><subject>Research and development</subject><subject>Routing</subject><subject>Specifications</subject><subject>System testing</subject><subject>Temporal logic</subject><issn>1545-5955</issn><issn>1558-3783</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqFkcFrFTEQxhexYG29C16CoJ72mdkkm-RYatVCoQfrOeRlJ23Kvs2ayav0v3eXVyh40LnMMPObjxm-pnkLfAPA7eebsx8Xm45ztTE970G8aI5BKdMKbcTLtZaqVVapV81ronvOO2ksP27uviR_O2VKxHJkBWf0FQcWfRr3BYnFXNiQKBSsyPABp8rokSruiP1O9Y6NaUJf2pp2yJbunIsf2zHfpsBoxpBiCr6mPNFpcxT9SPjmKZ80P79e3Jx_b6-uv12en121QYKsba8CH4KIceBCdgg2aPQmehmMDhgMoPAAQ5RWSoEwbDurjTZbuQXPo-nFSfPpoDuX_GuPVN1uOR_H0U-Y9-SMsVJokHohP_6T7AwII6T5P6itBc7tAr7_C7zP-zIt77qOg1wDFogfoFAyUcHo5pJ2vjw64G610q1WutVKd7ByWfnwpOsp-DEWP4VEz3taWC66VfrdgUuI-DxWfd8rLf4AajSoVw</recordid><startdate>200601</startdate><enddate>200601</enddate><creator>Shengbing Jiang</creator><creator>Kumar, R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>H8D</scope><scope>F28</scope></search><sort><creationdate>200601</creationdate><title>Diagnosis of repeated failures for discrete event systems with linear-time temporal-logic specifications</title><author>Shengbing Jiang ; Kumar, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c414t-65c0dc3ffd0342e19c7ea8fa4c87cec81e3a11df49443e1db297878b4b1a0f863</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Algorithms</topic><topic>Applied sciences</topic><topic>Combinatorics</topic><topic>Computer science; control theory; systems</topic><topic>Control theory. Systems</topic><topic>Delay</topic><topic>Delay effects</topic><topic>Diagnosis</topic><topic>Diagnostics</topic><topic>Discrete event system</topic><topic>Discrete event systems</topic><topic>Event detection</topic><topic>Event driven simulation</topic><topic>Exact sciences and technology</topic><topic>Failure</topic><topic>Failure analysis</topic><topic>Formal specifications</topic><topic>Invariants</topic><topic>linear-time temporal logic (LTL)</topic><topic>Logic</topic><topic>Logic programming</topic><topic>Manufacturing systems</topic><topic>Operational research and scientific management</topic><topic>Operational research. Management science</topic><topic>Polynomials</topic><topic>Reliability theory. Replacement problems</topic><topic>repeated failure diagnosis</topic><topic>Research and development</topic><topic>Routing</topic><topic>Specifications</topic><topic>System testing</topic><topic>Temporal logic</topic><toplevel>online_resources</toplevel><creatorcontrib>Shengbing Jiang</creatorcontrib><creatorcontrib>Kumar, R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005–Present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Aerospace Database</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><jtitle>IEEE transactions on automation science and engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Shengbing Jiang</au><au>Kumar, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Diagnosis of repeated failures for discrete event systems with linear-time temporal-logic specifications</atitle><jtitle>IEEE transactions on automation science and engineering</jtitle><stitle>TASE</stitle><date>2006-01</date><risdate>2006</risdate><volume>3</volume><issue>1</issue><spage>47</spage><epage>59</epage><pages>47-59</pages><issn>1545-5955</issn><eissn>1558-3783</eissn><coden>ITASC7</coden><abstract>In our earlier work, we introduced a state-based approach for the diagnosis of repeatedly occurring failures in discrete event systems (DESs). Since temporal logic provides a simpler way of specifying system properties; in this paper, a temporal-logic-based approach for diagnosing the occurrence of a repeated number of failures is developed. Linear-time temporal-logic (LTL) formulae are used to represent the specifications of DESs. Notions of prediagnosability for failures and diagnosability for repeated failures are introduced in the setting of temporal logic. A polynomial algorithm for the test of prediagnosability for failures is provided. The diagnosis problem for repeated failures in the temporal-logic setting is reduced to one in a state-based setting, and so the prior results of a state-based repeated failure diagnosis can be applied. Finally, a simple example is given for illustration. Note to Practitioners-Certain failures in a system are repeatable, such as routing errors in a manufacturing system. A theory for the diagnosis of such failures was presented in an earlier work of Jiang et al. The present paper uses temporal logic to specify such failures. It turns out that repeatable failures can be specified as violations of invariant properties (i.e., properties that must always hold). Given an invariant property that the system must always satisfy, an algorithm is presented to refine the system model and label those states of the refined system where the property is violated. The problem of repeated diagnosis then requires determining, within a bounded delay, each time a "failure-state" is visited. For this analysis, the existing theory developed by Jiang et al. is used.</abstract><cop>Piscataway, NJ</cop><pub>IEEE</pub><doi>10.1109/TASE.2005.860613</doi><tpages>13</tpages></addata></record> |
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subjects | Algorithms Applied sciences Combinatorics Computer science control theory systems Control theory. Systems Delay Delay effects Diagnosis Diagnostics Discrete event system Discrete event systems Event detection Event driven simulation Exact sciences and technology Failure Failure analysis Formal specifications Invariants linear-time temporal logic (LTL) Logic Logic programming Manufacturing systems Operational research and scientific management Operational research. Management science Polynomials Reliability theory. Replacement problems repeated failure diagnosis Research and development Routing Specifications System testing Temporal logic |
title | Diagnosis of repeated failures for discrete event systems with linear-time temporal-logic specifications |
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