Near-field multi-slice ptychography: quantitative phase imaging of optically thick samples with visible light and X-rays

Ptychography is a form of lens-free coherent diffractive imaging now used extensively in electron and synchrotron-based X-ray microscopy. In its near-field implementation, it offers a route to quantitative phase imaging at an accuracy and resolution competitive with holography, with the added advant...

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Veröffentlicht in:Optics express 2023-05, Vol.31 (10), p.15791-15809
Hauptverfasser: Hu, Ziyang, Zhang, Yiqian, Li, Peng, Batey, Darren, Maiden, Andrew
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container_title Optics express
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creator Hu, Ziyang
Zhang, Yiqian
Li, Peng
Batey, Darren
Maiden, Andrew
description Ptychography is a form of lens-free coherent diffractive imaging now used extensively in electron and synchrotron-based X-ray microscopy. In its near-field implementation, it offers a route to quantitative phase imaging at an accuracy and resolution competitive with holography, with the added advantages of extended field of view and blind deconvolution of the illumination beam profile from the sample image. In this paper we show how near-field ptychography can be combined with a multi-slice model, adding to this list of advantages the unique ability to recover high-resolution phase images of larger samples, whose thickness places them beyond the depth of field of alternative methods.
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title Near-field multi-slice ptychography: quantitative phase imaging of optically thick samples with visible light and X-rays
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