Characteristics of pentacene-based thin-film transistors
Pentacene was used as an active layer of organic thin-film transistors (TFTs) by depositing with the vacuum thermal evaporation. It is revealed that the deposition rate of pentacene may have critical effects on the electrical properties of pentacene-based TFTs. For the device fabrication, pentacene...
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Veröffentlicht in: | Materials Science & Engineering C 2004-01, Vol.24 (1), p.27-29 |
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creator | Park, Jae Hoon Kang, Chang Heon Kim, Yeon Ju Lee, Yong Soo Choi, Jong Sun |
description | Pentacene was used as an active layer of organic thin-film transistors (TFTs) by depositing with the vacuum thermal evaporation. It is revealed that the deposition rate of pentacene may have critical effects on the electrical properties of pentacene-based TFTs. For the device fabrication, pentacene layers were deposited at a rate of 0.5, 1.0 and 2.5 Å/s. Upon the investigations, TFT with the pentacene layer deposited at a rate of 2.5 Å/s showed the most superior properties. The field-effect mobility of 0.16 cm
2/V s, and the on/off current ratio of 10
5 were obtained at a drain voltage of −30 V. To study the correlation between the deposition rate and the device performance, the capacitance properties were also measured in the metal/insulator/organic semiconductor (MIS) structure device by employing the capacitance–voltage (
C–
V) measurements. The lowest capacitance value was observed in the device with the pentacene layer deposited at a rate of 2.5 Å/s. |
doi_str_mv | 10.1016/j.msec.2003.09.064 |
format | Article |
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2/V s, and the on/off current ratio of 10
5 were obtained at a drain voltage of −30 V. To study the correlation between the deposition rate and the device performance, the capacitance properties were also measured in the metal/insulator/organic semiconductor (MIS) structure device by employing the capacitance–voltage (
C–
V) measurements. The lowest capacitance value was observed in the device with the pentacene layer deposited at a rate of 2.5 Å/s.</description><identifier>ISSN: 0928-4931</identifier><identifier>EISSN: 1873-0191</identifier><identifier>DOI: 10.1016/j.msec.2003.09.064</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Capacitance–voltage ; MIS ; Organic TFTs ; Pentacene</subject><ispartof>Materials Science & Engineering C, 2004-01, Vol.24 (1), p.27-29</ispartof><rights>2003 Elsevier B.V.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c439t-c1a5037c2ff937a1cef556917a5af8225cfd2806bb827def539283f67a8dde853</citedby><cites>FETCH-LOGICAL-c439t-c1a5037c2ff937a1cef556917a5af8225cfd2806bb827def539283f67a8dde853</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0928493103001474$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65534</link.rule.ids></links><search><creatorcontrib>Park, Jae Hoon</creatorcontrib><creatorcontrib>Kang, Chang Heon</creatorcontrib><creatorcontrib>Kim, Yeon Ju</creatorcontrib><creatorcontrib>Lee, Yong Soo</creatorcontrib><creatorcontrib>Choi, Jong Sun</creatorcontrib><title>Characteristics of pentacene-based thin-film transistors</title><title>Materials Science & Engineering C</title><description>Pentacene was used as an active layer of organic thin-film transistors (TFTs) by depositing with the vacuum thermal evaporation. It is revealed that the deposition rate of pentacene may have critical effects on the electrical properties of pentacene-based TFTs. For the device fabrication, pentacene layers were deposited at a rate of 0.5, 1.0 and 2.5 Å/s. Upon the investigations, TFT with the pentacene layer deposited at a rate of 2.5 Å/s showed the most superior properties. The field-effect mobility of 0.16 cm
2/V s, and the on/off current ratio of 10
5 were obtained at a drain voltage of −30 V. To study the correlation between the deposition rate and the device performance, the capacitance properties were also measured in the metal/insulator/organic semiconductor (MIS) structure device by employing the capacitance–voltage (
C–
V) measurements. The lowest capacitance value was observed in the device with the pentacene layer deposited at a rate of 2.5 Å/s.</description><subject>Capacitance–voltage</subject><subject>MIS</subject><subject>Organic TFTs</subject><subject>Pentacene</subject><issn>0928-4931</issn><issn>1873-0191</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LAzEQhoMoWKt_wNOevO06SfYjAS9S_IKCFz2HNDuhKftRM6ngvzelnj3NYd7nZeZh7JZDxYG397tqJHSVAJAV6Ara-owtuOpkCVzzc7YALVRZa8kv2RXRDqBVshMLplZbG61LGAOl4KiYfbHHKVmHE5YbS9gXaRum0odhLFK0E-XgHOmaXXg7EN78zSX7fH76WL2W6_eXt9XjunS11Kl03DYgOye817Kz3KFvmlbzzjbWKyEa53uhoN1slOj6vJT5UOnbzqq-R9XIJbs79e7j_HVASmYM5HAY7ITzgUyGlapB5aA4BV2ciSJ6s49htPHHcDBHSWZnjpLMUZIBbbKkDD2cIMwvfAeMhlzAyWEfIrpk-jn8h_8CozZwsQ</recordid><startdate>20040105</startdate><enddate>20040105</enddate><creator>Park, Jae Hoon</creator><creator>Kang, Chang Heon</creator><creator>Kim, Yeon Ju</creator><creator>Lee, Yong Soo</creator><creator>Choi, Jong Sun</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20040105</creationdate><title>Characteristics of pentacene-based thin-film transistors</title><author>Park, Jae Hoon ; Kang, Chang Heon ; Kim, Yeon Ju ; Lee, Yong Soo ; Choi, Jong Sun</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c439t-c1a5037c2ff937a1cef556917a5af8225cfd2806bb827def539283f67a8dde853</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Capacitance–voltage</topic><topic>MIS</topic><topic>Organic TFTs</topic><topic>Pentacene</topic><toplevel>online_resources</toplevel><creatorcontrib>Park, Jae Hoon</creatorcontrib><creatorcontrib>Kang, Chang Heon</creatorcontrib><creatorcontrib>Kim, Yeon Ju</creatorcontrib><creatorcontrib>Lee, Yong Soo</creatorcontrib><creatorcontrib>Choi, Jong Sun</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Materials Science & Engineering C</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Park, Jae Hoon</au><au>Kang, Chang Heon</au><au>Kim, Yeon Ju</au><au>Lee, Yong Soo</au><au>Choi, Jong Sun</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characteristics of pentacene-based thin-film transistors</atitle><jtitle>Materials Science & Engineering C</jtitle><date>2004-01-05</date><risdate>2004</risdate><volume>24</volume><issue>1</issue><spage>27</spage><epage>29</epage><pages>27-29</pages><issn>0928-4931</issn><eissn>1873-0191</eissn><abstract>Pentacene was used as an active layer of organic thin-film transistors (TFTs) by depositing with the vacuum thermal evaporation. It is revealed that the deposition rate of pentacene may have critical effects on the electrical properties of pentacene-based TFTs. For the device fabrication, pentacene layers were deposited at a rate of 0.5, 1.0 and 2.5 Å/s. Upon the investigations, TFT with the pentacene layer deposited at a rate of 2.5 Å/s showed the most superior properties. The field-effect mobility of 0.16 cm
2/V s, and the on/off current ratio of 10
5 were obtained at a drain voltage of −30 V. To study the correlation between the deposition rate and the device performance, the capacitance properties were also measured in the metal/insulator/organic semiconductor (MIS) structure device by employing the capacitance–voltage (
C–
V) measurements. The lowest capacitance value was observed in the device with the pentacene layer deposited at a rate of 2.5 Å/s.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.msec.2003.09.064</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Capacitance–voltage MIS Organic TFTs Pentacene |
title | Characteristics of pentacene-based thin-film transistors |
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