Characterization on nanocrystallization and amorphization evolution in Zr–X alloys during ARB process

The gradual evolution of the nanocrystallization and amorphization processes in various Zr–X-based binary, ternary, and pentanary alloys during accumulative roll bonding (ARB) are characterized by Scanning and transmission electron microscopy (SEM and TEM), in correlation with X-ray diffraction (XRD...

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Veröffentlicht in:Materials chemistry and physics 2004-12, Vol.88 (2), p.364-376
Hauptverfasser: Hsieh, P.J., Huang, J.C., Hung, Y.P., Chou, S.I., Jang, J.S.C.
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Sprache:eng
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