SIMS: from research to production control
In 1958, when I joined the Philips Research Laboratories, there were a number of technological problems related to the analysis of solids within Philips that needed analytical support. Because the available (bulk) techniques did not give sufficient results, a new technique, later called secondary io...
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Veröffentlicht in: | Surface and interface analysis 2003-11, Vol.35 (11), p.859-879 |
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Format: | Artikel |
Sprache: | eng |
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