Raman spectroscopic studies of amorphous vanadium oxide thin films
We report on the microstructural changes of amorphous V 2O 5 films with lithium intercalation. The Raman spectra of as-deposited films show two broad peaks around at 520 and 650 cm −1, due to the stretching modes of the V 3–O and V 2–O bonds, respectively, and a relatively sharp peak at 1027 cm −1 d...
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Veröffentlicht in: | Solid state ionics 2003-12, Vol.165 (1), p.111-116 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We report on the microstructural changes of amorphous V
2O
5 films with lithium intercalation. The Raman spectra of as-deposited films show two broad peaks around at 520 and 650 cm
−1, due to the stretching modes of the V
3–O and V
2–O bonds, respectively, and a relatively sharp peak at 1027 cm
−1 due to the V
5+O stretching mode of terminal oxygen atoms. In addition, there is a peak at 932 cm
−1 that we attribute to the V
4+O bonds. Comparison of the Raman spectra of V
2O
5 films with different oxygen deficiencies confirms this assignment. This Raman peak due to the stretching mode of the V
4+O bonds develops and shifts toward lower frequencies with increasing lithium concentration. Comparison to results from gasochromic hydrogen insertion indicates that the 932 cm
−1 Raman peak is not a result of vibrations which involve Li or H atoms. We propose that the V
4+O bonds are created by two different mechanisms: a direct conversion from V
5+O bonds and the breaking of the single oxygen bonds involving V
4+ ions. |
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ISSN: | 0167-2738 1872-7689 |
DOI: | 10.1016/j.ssi.2003.08.022 |