Refractive index measurements of planar chalcogenide thin film
We report on the measurements of the refractive index of As–S–Se chalcogenide glasses near 1.55 μm. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As 40S 60− x Se x and t...
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| Veröffentlicht in: | Journal of non-crystalline solids 2003-10, Vol.328 (1), p.183-191 |
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| container_end_page | 191 |
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| container_issue | 1 |
| container_start_page | 183 |
| container_title | Journal of non-crystalline solids |
| container_volume | 328 |
| creator | Laniel, Jacques M Ménard, Jean-Michel Turcotte, Karine Villeneuve, Alain Vallée, Réal Lopez, Cédric Richardson, Kathleen A |
| description | We report on the measurements of the refractive index of As–S–Se chalcogenide glasses near 1.55 μm. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As
40S
60−
x
Se
x
and the compositions As
x
S
(100−
x)/2
Se
(100−
x)/2
where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index. In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is ±0.2%. |
| doi_str_mv | 10.1016/S0022-3093(03)00527-1 |
| format | Article |
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40S
60−
x
Se
x
and the compositions As
x
S
(100−
x)/2
Se
(100−
x)/2
where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index. In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is ±0.2%.</description><identifier>ISSN: 0022-3093</identifier><identifier>EISSN: 1873-4812</identifier><identifier>DOI: 10.1016/S0022-3093(03)00527-1</identifier><identifier>CODEN: JNCSBJ</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Amorphous semiconductors; glasses ; Amorphous semiconductors; glasses; nanocrystalline materials ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of specific thin films ; Physics</subject><ispartof>Journal of non-crystalline solids, 2003-10, Vol.328 (1), p.183-191</ispartof><rights>2003 Elsevier B.V.</rights><rights>2003 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c368t-3f5cc65f9554ac067deec4901df8b3baeda61373c71382b3a1bcaf7a4abf85bf3</citedby><cites>FETCH-LOGICAL-c368t-3f5cc65f9554ac067deec4901df8b3baeda61373c71382b3a1bcaf7a4abf85bf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/S0022-3093(03)00527-1$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15145633$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Laniel, Jacques M</creatorcontrib><creatorcontrib>Ménard, Jean-Michel</creatorcontrib><creatorcontrib>Turcotte, Karine</creatorcontrib><creatorcontrib>Villeneuve, Alain</creatorcontrib><creatorcontrib>Vallée, Réal</creatorcontrib><creatorcontrib>Lopez, Cédric</creatorcontrib><creatorcontrib>Richardson, Kathleen A</creatorcontrib><title>Refractive index measurements of planar chalcogenide thin film</title><title>Journal of non-crystalline solids</title><description>We report on the measurements of the refractive index of As–S–Se chalcogenide glasses near 1.55 μm. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As
40S
60−
x
Se
x
and the compositions As
x
S
(100−
x)/2
Se
(100−
x)/2
where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index. In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is ±0.2%.</description><subject>Amorphous semiconductors; glasses</subject><subject>Amorphous semiconductors; glasses; nanocrystalline materials</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of specific thin films</subject><subject>Physics</subject><issn>0022-3093</issn><issn>1873-4812</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqFkEtLAzEQgIMoWKs_QdiLoofVZLPZbC-KFF9QEHycw-zsxEb2UZNt0X9vakWPDgNz-eb1MXYo-Jngojh_4jzLUskn8oTLU85VplOxxUai1DLNS5Fts9Evssv2QnjjMbQsR-zikawHHNyKEtfV9JG0BGHpqaVuCElvk0UDHfgE59Bg_0qdqykZ5q5LrGvafbZjoQl08FPH7OXm-nl6l84ebu-nV7MUZVEOqbQKsVB2olQOyAtdE2E-4aK2ZSUroBoKIbVELWSZVRJEhWA15FDZUlVWjtnxZu7C9-9LCoNpXUBq4m3UL4PJ9ERlolARVBsQfR-CJ2sW3rXgP43gZm3LfNsyaxWGx1zbMiL2Hf0sgIDQRCcduvDXrESuCikjd7nhKH67cuRNQEcdUu084WDq3v2z6QvMQn8j</recordid><startdate>20031015</startdate><enddate>20031015</enddate><creator>Laniel, Jacques M</creator><creator>Ménard, Jean-Michel</creator><creator>Turcotte, Karine</creator><creator>Villeneuve, Alain</creator><creator>Vallée, Réal</creator><creator>Lopez, Cédric</creator><creator>Richardson, Kathleen A</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20031015</creationdate><title>Refractive index measurements of planar chalcogenide thin film</title><author>Laniel, Jacques M ; Ménard, Jean-Michel ; Turcotte, Karine ; Villeneuve, Alain ; Vallée, Réal ; Lopez, Cédric ; Richardson, Kathleen A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c368t-3f5cc65f9554ac067deec4901df8b3baeda61373c71382b3a1bcaf7a4abf85bf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Amorphous semiconductors; glasses</topic><topic>Amorphous semiconductors; glasses; nanocrystalline materials</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of specific thin films</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Laniel, Jacques M</creatorcontrib><creatorcontrib>Ménard, Jean-Michel</creatorcontrib><creatorcontrib>Turcotte, Karine</creatorcontrib><creatorcontrib>Villeneuve, Alain</creatorcontrib><creatorcontrib>Vallée, Réal</creatorcontrib><creatorcontrib>Lopez, Cédric</creatorcontrib><creatorcontrib>Richardson, Kathleen A</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of non-crystalline solids</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Laniel, Jacques M</au><au>Ménard, Jean-Michel</au><au>Turcotte, Karine</au><au>Villeneuve, Alain</au><au>Vallée, Réal</au><au>Lopez, Cédric</au><au>Richardson, Kathleen A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Refractive index measurements of planar chalcogenide thin film</atitle><jtitle>Journal of non-crystalline solids</jtitle><date>2003-10-15</date><risdate>2003</risdate><volume>328</volume><issue>1</issue><spage>183</spage><epage>191</epage><pages>183-191</pages><issn>0022-3093</issn><eissn>1873-4812</eissn><coden>JNCSBJ</coden><abstract>We report on the measurements of the refractive index of As–S–Se chalcogenide glasses near 1.55 μm. The measurements were made on annealed and non-annealed samples of thermally evaporated thin films. The data for two different series of glasses are presented: the compositions As
40S
60−
x
Se
x
and the compositions As
x
S
(100−
x)/2
Se
(100−
x)/2
where the ratio of sulfur to selenium is kept constant (1:1). It has been found that replacing sulfur by selenium in the first series increases the refractive index from 2.4 to 2.8 and increasing the arsenic content in the second series increases the refractive index. In all cases, it has been found that annealing the samples increase the refractive index. The accuracy in the refractive index measurement is ±0.2%.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/S0022-3093(03)00527-1</doi><tpages>9</tpages></addata></record> |
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| language | eng |
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| subjects | Amorphous semiconductors glasses Amorphous semiconductors glasses nanocrystalline materials Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics |
| title | Refractive index measurements of planar chalcogenide thin film |
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