Paramagnetic-to-antiferromagnetic phase transformation in sputter-deposited Ni-Mn thin films

Sputter-deposited, equiatomic Ni-Mn thin films were observed to possess a metastable, nanocrystalline, chemically disordered, fcc (Al) structure. Grain growth and a phase change to a chemically ordered, antiferromagnetic Ll0 structure were identified by x-ray diffraction (XRD) and transmission elect...

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Veröffentlicht in:Journal of electronic materials 2003-11, Vol.32 (11), p.1155-1159
Hauptverfasser: LADWIG, Peter F, YING YANG, LING DING, TSU, I.-Fei, CHANG, Y. Austin
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Sprache:eng
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