Paramagnetic-to-antiferromagnetic phase transformation in sputter-deposited Ni-Mn thin films
Sputter-deposited, equiatomic Ni-Mn thin films were observed to possess a metastable, nanocrystalline, chemically disordered, fcc (Al) structure. Grain growth and a phase change to a chemically ordered, antiferromagnetic Ll0 structure were identified by x-ray diffraction (XRD) and transmission elect...
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Veröffentlicht in: | Journal of electronic materials 2003-11, Vol.32 (11), p.1155-1159 |
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Sprache: | eng |
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