In situ TEM observations of fracture in nanolaminated metallic thin films

Fracture of single crystal nanolaminated thin films has been investigated through in situ straining of cross-sectional samples of Cu/Ni nanolaminates grown on Cu (001) single crystal substrates. The earlest stages of deformation exhibits a confined layer slip mechanism. With continued straining, uns...

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Veröffentlicht in:	International journal of fracture 2003-01, Vol.119/120 (4-2), p.351-357
Hauptverfasser:	Foecke, T., Kramer, D.E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bilayers Copper Crack propagation Crack tips Deformation mechanisms Dislocations Nickel Plastic deformation Plastic zones Single crystals Substrates Thin films Transmission electron microscopy
Online-Zugang:	Volltext
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