An interfacial defect layer observed at (Ba, Sr)TiO3/Pt interface
Barium strontium titanate (Ba,Sr)TiO3 (BST) thin-films on Pt-substrates were studied by transmission electron microscopy. The films show a columnar structure with the grains of 10-50 nm in diameter. These are oriented parallel to the [001] direction which in turn is parallel to the film growth direc...
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| Veröffentlicht in: | Thin solid films 2003-04, Vol.429 (1-2), p.282-285 |
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| container_title | Thin solid films |
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| creator | JIN, H. Z ZHU, J EHRHART, P FITSILIS, F JIA, C. L REGNERY, S URBAN, K WASER, R |
| description | Barium strontium titanate (Ba,Sr)TiO3 (BST) thin-films on Pt-substrates were studied by transmission electron microscopy. The films show a columnar structure with the grains of 10-50 nm in diameter. These are oriented parallel to the [001] direction which in turn is parallel to the film growth direction. No amorphous intergrain regions occur. The high-resolution lattice fringe pictures show for the first time that over horizontally extended areas of the interface the lattice of the BST film is modified by the introduction of a defect layer. This observation is discussed in terms of a structural origin of the so-called dead-layer effect responsible for a reduction of the film permittivity with decreasing foil thickness. |
| doi_str_mv | 10.1016/S0040-6090(02)01330-5 |
| format | Article |
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This observation is discussed in terms of a structural origin of the so-called dead-layer effect responsible for a reduction of the film permittivity with decreasing foil thickness.</description><subject>Applied sciences</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Diffusion; interface formation</subject><subject>Exact sciences and technology</subject><subject>Metals. 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Metallurgy</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>JIN, H. Z</creatorcontrib><creatorcontrib>ZHU, J</creatorcontrib><creatorcontrib>EHRHART, P</creatorcontrib><creatorcontrib>FITSILIS, F</creatorcontrib><creatorcontrib>JIA, C. 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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Applied sciences Condensed matter: structure, mechanical and thermal properties Diffusion interface formation Exact sciences and technology Metals. Metallurgy Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | An interfacial defect layer observed at (Ba, Sr)TiO3/Pt interface |
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