An elastic–plastic shear lag model for fracture of layered coatings
We present a phenomenological model describing cracking under uniaxial tensile strain of a brittle thin film on a deformable substrate with an elastic–plastic interface layer. The model yields an analytical solution predicting average crack density and average crack opening as a function of applied...
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| Veröffentlicht in: | Thin solid films 2003-01, Vol.424 (2), p.219-223 |
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| container_title | Thin solid films |
| container_volume | 424 |
| creator | McGuigan, A.P Briggs, G.A.D Burlakov, V.M Yanaka, M Tsukahara, Y |
| description | We present a phenomenological model describing cracking under uniaxial tensile strain of a brittle thin film on a deformable substrate with an elastic–plastic interface layer. The model yields an analytical solution predicting average crack density and average crack opening as a function of applied strain and material parameters. The model has been applied to experimental data for cracks in thin SiO
x
films on PET substrates. |
| doi_str_mv | 10.1016/S0040-6090(02)01124-0 |
| format | Article |
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x
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films on PET substrates.</description><subject>Brittle thin film</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Crack density</subject><subject>Ductile substrate</subject><subject>Elastic–plastic interlayer</subject><subject>Exact sciences and technology</subject><subject>Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties</subject><subject>Mechanical and acoustical properties</subject><subject>Physical properties of thin films, nonelectronic</subject><subject>Physics</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqNkM1KxDAQx4MouK4-gpCLoofqJE2b5iSyrB-w4EE9hzSdrJFuuyZdYW--g2_ok9j9QI_KHGZgfjN_-BFyzOCCAcsvHwEEJDkoOAN-DoxxkcAOGbBCqoTLlO2SwQ-yTw5ifAUAxnk6IOPrhmJtYuft18fnfDPR-IIm0NpM6aytsKauDdQFY7tFQNq6frPEgBW1rel8M42HZM-ZOuLRtg_J8834aXSXTB5u70fXk8SKPOsShTnjTBnJSpMJSJkqQQrnShQK0rIwGRSsdLlgRhUMKsTSSp6idVxy5Xg6JKebv_PQvi0wdnrmo8W6Ng22i6i5LAohVf4fMM1SJXsw24A2tDEGdHoe_MyEpWagV3b12q5eqdPA9dquhv7uZBtgojV1L6exPv4eiyyHvnruasNhr-XdY9DRemwsVj6g7XTV-j-SvgF5do39</recordid><startdate>20030101</startdate><enddate>20030101</enddate><creator>McGuigan, A.P</creator><creator>Briggs, G.A.D</creator><creator>Burlakov, V.M</creator><creator>Yanaka, M</creator><creator>Tsukahara, Y</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7SR</scope></search><sort><creationdate>20030101</creationdate><title>An elastic–plastic shear lag model for fracture of layered coatings</title><author>McGuigan, A.P ; Briggs, G.A.D ; Burlakov, V.M ; Yanaka, M ; Tsukahara, Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c465t-9e61219a71ba540319b074ffbe4903b8a5081bf641a9810deebc723ecf2729f23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Brittle thin film</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Crack density</topic><topic>Ductile substrate</topic><topic>Elastic–plastic interlayer</topic><topic>Exact sciences and technology</topic><topic>Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties</topic><topic>Mechanical and acoustical properties</topic><topic>Physical properties of thin films, nonelectronic</topic><topic>Physics</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>McGuigan, A.P</creatorcontrib><creatorcontrib>Briggs, G.A.D</creatorcontrib><creatorcontrib>Burlakov, V.M</creatorcontrib><creatorcontrib>Yanaka, M</creatorcontrib><creatorcontrib>Tsukahara, Y</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Engineered Materials Abstracts</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>McGuigan, A.P</au><au>Briggs, G.A.D</au><au>Burlakov, V.M</au><au>Yanaka, M</au><au>Tsukahara, Y</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An elastic–plastic shear lag model for fracture of layered coatings</atitle><jtitle>Thin solid films</jtitle><date>2003-01-01</date><risdate>2003</risdate><volume>424</volume><issue>2</issue><spage>219</spage><epage>223</epage><pages>219-223</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>We present a phenomenological model describing cracking under uniaxial tensile strain of a brittle thin film on a deformable substrate with an elastic–plastic interface layer. The model yields an analytical solution predicting average crack density and average crack opening as a function of applied strain and material parameters. The model has been applied to experimental data for cracks in thin SiO
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| ispartof | Thin solid films, 2003-01, Vol.424 (2), p.219-223 |
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| source | Elsevier ScienceDirect Journals |
| subjects | Brittle thin film Condensed matter: structure, mechanical and thermal properties Crack density Ductile substrate Elastic–plastic interlayer Exact sciences and technology Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Mechanical and acoustical properties Physical properties of thin films, nonelectronic Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | An elastic–plastic shear lag model for fracture of layered coatings |
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