Fundamental properties of ferromagnetic micro- and nanostructured semiconductors for optoelectronic application
Magneto-optical methods were applied for investigating the properties of Co/Cu/Co spin-valves deposited on Si substrate. The effects of electron transport and irradiation on remagnetization of such ferromagnetic (spin-valve)/semiconductor structures were studied for various thicknesses of ferromagne...
Gespeichert in:
Veröffentlicht in: | Materials science & engineering. B, Solid-state materials for advanced technology Solid-state materials for advanced technology, 2003-08, Vol.101 (1), p.246-248 |
---|---|
Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 248 |
---|---|
container_issue | 1 |
container_start_page | 246 |
container_title | Materials science & engineering. B, Solid-state materials for advanced technology |
container_volume | 101 |
creator | Sohatsky, V.P. Kovalenko, V.F. Lysko, O.I. Vysokolyan, O.P. Gorchinskiy, A.D. Buzaneva, E.V. |
description | Magneto-optical methods were applied for investigating the properties of Co/Cu/Co spin-valves deposited on Si substrate. The effects of electron transport and irradiation on remagnetization of such ferromagnetic (spin-valve)/semiconductor structures were studied for various thicknesses of ferromagnetic and non-magnetic layers. |
doi_str_mv | 10.1016/S0921-5107(02)00672-4 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_27870116</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0921510702006724</els_id><sourcerecordid>27870116</sourcerecordid><originalsourceid>FETCH-LOGICAL-c286t-739c805cb232b7d8e05ac365844088ed10013f3b4a36cf276c420ae726f40c473</originalsourceid><addsrcrecordid>eNqFkEFLxDAQhYMouK7-BCEn0UN1kqZN9ySyuCoseFDPIZtOJdImNUkF_73ZXfHqaRjmvcd8j5BzBtcMWH3zAgvOioqBvAR-BVBLXogDMmONLAuxEOKQzP4kx-Qkxg8AYJzzGfGrybV6QJd0T8fgRwzJYqS-ox2G4Af97jBZQwdrgi-odi112vmYwmTSFLClEfPNuzbvPkTa-UD9mDz2aFLwLnv1OPbW6GS9OyVHne4jnv3OOXlb3b8uH4v188PT8m5dGN7UqZDlwjRQmQ0v-Ua2DUKlTVlXjRDQNNiy_H_ZlRuhy9p0XNZGcNAoed0JMEKWc3Kxz81MnxPGpAYbDfa9duinqLhsJDBWZ2G1F2a8GAN2agx20OFbMVDbetWuXrXtTgFXu3qVyL7bvQ8zxZfFoKKx6Ay2NmRw1Xr7T8IPEwqEbQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>27870116</pqid></control><display><type>article</type><title>Fundamental properties of ferromagnetic micro- and nanostructured semiconductors for optoelectronic application</title><source>Elsevier ScienceDirect Journals</source><creator>Sohatsky, V.P. ; Kovalenko, V.F. ; Lysko, O.I. ; Vysokolyan, O.P. ; Gorchinskiy, A.D. ; Buzaneva, E.V.</creator><creatorcontrib>Sohatsky, V.P. ; Kovalenko, V.F. ; Lysko, O.I. ; Vysokolyan, O.P. ; Gorchinskiy, A.D. ; Buzaneva, E.V.</creatorcontrib><description>Magneto-optical methods were applied for investigating the properties of Co/Cu/Co spin-valves deposited on Si substrate. The effects of electron transport and irradiation on remagnetization of such ferromagnetic (spin-valve)/semiconductor structures were studied for various thicknesses of ferromagnetic and non-magnetic layers.</description><identifier>ISSN: 0921-5107</identifier><identifier>EISSN: 1873-4944</identifier><identifier>DOI: 10.1016/S0921-5107(02)00672-4</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Magnetoresistance ; Optical and electronic properties ; Spin-valve</subject><ispartof>Materials science & engineering. B, Solid-state materials for advanced technology, 2003-08, Vol.101 (1), p.246-248</ispartof><rights>2003 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0921510702006724$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Sohatsky, V.P.</creatorcontrib><creatorcontrib>Kovalenko, V.F.</creatorcontrib><creatorcontrib>Lysko, O.I.</creatorcontrib><creatorcontrib>Vysokolyan, O.P.</creatorcontrib><creatorcontrib>Gorchinskiy, A.D.</creatorcontrib><creatorcontrib>Buzaneva, E.V.</creatorcontrib><title>Fundamental properties of ferromagnetic micro- and nanostructured semiconductors for optoelectronic application</title><title>Materials science & engineering. B, Solid-state materials for advanced technology</title><description>Magneto-optical methods were applied for investigating the properties of Co/Cu/Co spin-valves deposited on Si substrate. The effects of electron transport and irradiation on remagnetization of such ferromagnetic (spin-valve)/semiconductor structures were studied for various thicknesses of ferromagnetic and non-magnetic layers.</description><subject>Magnetoresistance</subject><subject>Optical and electronic properties</subject><subject>Spin-valve</subject><issn>0921-5107</issn><issn>1873-4944</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2003</creationdate><recordtype>article</recordtype><recordid>eNqFkEFLxDAQhYMouK7-BCEn0UN1kqZN9ySyuCoseFDPIZtOJdImNUkF_73ZXfHqaRjmvcd8j5BzBtcMWH3zAgvOioqBvAR-BVBLXogDMmONLAuxEOKQzP4kx-Qkxg8AYJzzGfGrybV6QJd0T8fgRwzJYqS-ox2G4Af97jBZQwdrgi-odi112vmYwmTSFLClEfPNuzbvPkTa-UD9mDz2aFLwLnv1OPbW6GS9OyVHne4jnv3OOXlb3b8uH4v188PT8m5dGN7UqZDlwjRQmQ0v-Ua2DUKlTVlXjRDQNNiy_H_ZlRuhy9p0XNZGcNAoed0JMEKWc3Kxz81MnxPGpAYbDfa9duinqLhsJDBWZ2G1F2a8GAN2agx20OFbMVDbetWuXrXtTgFXu3qVyL7bvQ8zxZfFoKKx6Ay2NmRw1Xr7T8IPEwqEbQ</recordid><startdate>20030815</startdate><enddate>20030815</enddate><creator>Sohatsky, V.P.</creator><creator>Kovalenko, V.F.</creator><creator>Lysko, O.I.</creator><creator>Vysokolyan, O.P.</creator><creator>Gorchinskiy, A.D.</creator><creator>Buzaneva, E.V.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20030815</creationdate><title>Fundamental properties of ferromagnetic micro- and nanostructured semiconductors for optoelectronic application</title><author>Sohatsky, V.P. ; Kovalenko, V.F. ; Lysko, O.I. ; Vysokolyan, O.P. ; Gorchinskiy, A.D. ; Buzaneva, E.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c286t-739c805cb232b7d8e05ac365844088ed10013f3b4a36cf276c420ae726f40c473</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2003</creationdate><topic>Magnetoresistance</topic><topic>Optical and electronic properties</topic><topic>Spin-valve</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sohatsky, V.P.</creatorcontrib><creatorcontrib>Kovalenko, V.F.</creatorcontrib><creatorcontrib>Lysko, O.I.</creatorcontrib><creatorcontrib>Vysokolyan, O.P.</creatorcontrib><creatorcontrib>Gorchinskiy, A.D.</creatorcontrib><creatorcontrib>Buzaneva, E.V.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Materials science & engineering. B, Solid-state materials for advanced technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sohatsky, V.P.</au><au>Kovalenko, V.F.</au><au>Lysko, O.I.</au><au>Vysokolyan, O.P.</au><au>Gorchinskiy, A.D.</au><au>Buzaneva, E.V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fundamental properties of ferromagnetic micro- and nanostructured semiconductors for optoelectronic application</atitle><jtitle>Materials science & engineering. B, Solid-state materials for advanced technology</jtitle><date>2003-08-15</date><risdate>2003</risdate><volume>101</volume><issue>1</issue><spage>246</spage><epage>248</epage><pages>246-248</pages><issn>0921-5107</issn><eissn>1873-4944</eissn><abstract>Magneto-optical methods were applied for investigating the properties of Co/Cu/Co spin-valves deposited on Si substrate. The effects of electron transport and irradiation on remagnetization of such ferromagnetic (spin-valve)/semiconductor structures were studied for various thicknesses of ferromagnetic and non-magnetic layers.</abstract><pub>Elsevier B.V</pub><doi>10.1016/S0921-5107(02)00672-4</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0921-5107 |
ispartof | Materials science & engineering. B, Solid-state materials for advanced technology, 2003-08, Vol.101 (1), p.246-248 |
issn | 0921-5107 1873-4944 |
language | eng |
recordid | cdi_proquest_miscellaneous_27870116 |
source | Elsevier ScienceDirect Journals |
subjects | Magnetoresistance Optical and electronic properties Spin-valve |
title | Fundamental properties of ferromagnetic micro- and nanostructured semiconductors for optoelectronic application |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-09T00%3A34%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Fundamental%20properties%20of%20ferromagnetic%20micro-%20and%20nanostructured%20semiconductors%20for%20optoelectronic%20application&rft.jtitle=Materials%20science%20&%20engineering.%20B,%20Solid-state%20materials%20for%20advanced%20technology&rft.au=Sohatsky,%20V.P.&rft.date=2003-08-15&rft.volume=101&rft.issue=1&rft.spage=246&rft.epage=248&rft.pages=246-248&rft.issn=0921-5107&rft.eissn=1873-4944&rft_id=info:doi/10.1016/S0921-5107(02)00672-4&rft_dat=%3Cproquest_cross%3E27870116%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=27870116&rft_id=info:pmid/&rft_els_id=S0921510702006724&rfr_iscdi=true |