Measuring lateral magnetic structures in thin films using time-of-flight polarized neutron reflectometry

Polarized neutron reflectometry (PNR) has recently been applied to study lateral magnetic structures such as regular micron-sized magnetic arrays on a surface. To date, however, there is a lack of detailed accounts of the features observed in the scattered intensity map in the special case of time-o...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Physica. B, Condensed matter Condensed matter, 2003-07, Vol.335 (1), p.77-81
Hauptverfasser:	Lee, W.-T., Klose, F., Yin, H.Q., Toperverg, B.P.
Format:	Artikel
Sprache:	eng
Schlagworte:	Distorted-wave Born approximation Lateral magnetic domains Off-specular scattering Patterned magnetic arrays Specular reflection Time-of-flight neutron reflectometry
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!